US 12,219,685 B2
Langmuir probe operating at fixed voltages
Aaron Michael Schinder, Englewood, OH (US); and Frans Hendrik Ebersohn, Palmdale, CA (US)
Assigned to Lockheed Martin Corporation, Bethesda, MD (US)
Filed by Lockheed Martin Corporation, Bethesda, MD (US)
Filed on Apr. 16, 2021, as Appl. No. 17/233,104.
Prior Publication US 2022/0338337 A1, Oct. 20, 2022
Int. Cl. H05H 1/00 (2006.01); H01J 37/32 (2006.01)
CPC H05H 1/0075 (2013.01) [H01J 37/32954 (2013.01); H05H 1/0081 (2013.01)] 14 Claims
OG exemplary drawing
 
6. A system for measuring a plasma, comprising:
a Langmuir probe, comprising:
a housing comprising an outer diameter and an inner diameter, wherein the inner diameter defines an inner cavity;
a plurality of cylindrical bodies disposed at least partially within the inner cavity, the plurality of cylindrical bodies being positioned in a parallel formation so as to abut each other within a grouping, wherein each of the plurality of cylindrical bodies comprises a set of internal cylindrical cavities; and
a plurality of double cylindrical Langmuir probes disposed within each pair of the set of internal cylindrical cavities;
a data acquisition system coupled to the Langmuir probe; and
an information handling system communicatively coupled to the data acquisition system.