US 12,219,274 B2
Imaging device and imaging method
Yuki Ozawa, Kanagawa (JP); Takehiro Otani, Kanagawa (JP); and Tomoyuki Hiro, Kumamoto (JP)
Assigned to SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa (JP)
Appl. No. 17/915,015
Filed by SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa (JP)
PCT Filed Mar. 30, 2021, PCT No. PCT/JP2021/013462
§ 371(c)(1), (2) Date Sep. 27, 2022,
PCT Pub. No. WO2021/205937, PCT Pub. Date Oct. 14, 2021.
Claims priority of application No. 2020-071037 (JP), filed on Apr. 10, 2020.
Prior Publication US 2023/0156354 A1, May 18, 2023
Int. Cl. H04N 25/47 (2023.01); H01L 27/146 (2006.01); H04N 25/77 (2023.01); H04N 25/79 (2023.01)
CPC H04N 25/47 (2023.01) [H01L 27/14634 (2013.01); H04N 25/77 (2023.01); H04N 25/79 (2023.01)] 17 Claims
OG exemplary drawing
 
1. An imaging device, comprising:
a photoelectric conversion element configured to photoelectrically convert incident light and generate an electrical signal corresponding to intensity of the incident light;
a threshold value selection circuit configured to select a specific threshold value from a plurality of threshold value candidates based on a current that flows through the photoelectric conversion element exceeds a specific current value; and
a detection unit configured to output a detection signal that indicates whether a change amount of the electrical signal exceeds the specific threshold value.