US 12,218,681 B2
Bit mask for syndrome decoding operations
Leon Zlotnik, Camino, CA (US); and Eyal En Gad, Highland, CA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Sep. 21, 2022, as Appl. No. 17/949,635.
Prior Publication US 2024/0097707 A1, Mar. 21, 2024
Int. Cl. H03M 13/00 (2006.01); H03M 13/11 (2006.01); H03M 13/15 (2006.01)
CPC H03M 13/1111 (2013.01) [H03M 13/1575 (2013.01); H03M 13/611 (2013.01)] 27 Claims
OG exemplary drawing
 
1. A method, comprising:
performing a decoding operation on a bit string by:
altering at least one bit of the bit string from a first value to a second value;
applying a bit mask to each bit of the bit string that is not altered from the first value to the second value such that the bit string includes at least one bit with the bit mask applied thereto and at least the one altered bit;
writing an indication corresponding to a quantity of bits that have been altered from the first value to the second value to an array of memory cells, wherein the indication corresponds to a quantity of errors contained in the bit string;
determining that the quantity of errors for the bit string has reached a threshold quantity of errors; and
refraining from performing a subsequent operation to alter at least the one altered bit of the bit string, or a different bit of the bit string, or both, from the first value to the second value in response to determining that the quantity of errors for the bit string has reached the threshold quantity of errors.