US 12,218,658 B2
System and method for identifying non-switching semiconductor switches
Matthias Ebert, Dettelbach (DE); Wolfgang Koch, Buchbrunn (DE); and Martin Roesler, Rosstal (DE)
Assigned to LEONI BORDNETZ-SYSTEME GMBH, Kitzingen (DE)
Appl. No. 17/768,732
Filed by LEONI BORDNETZ-SYSTEME GMBH, Kitzingen (DE)
PCT Filed Oct. 14, 2020, PCT No. PCT/EP2020/078905
§ 371(c)(1), (2) Date Apr. 13, 2022,
PCT Pub. No. WO2021/074225, PCT Pub. Date Apr. 22, 2021.
Claims priority of application No. 10 2019 127 733.7 (DE), filed on Oct. 15, 2019.
Prior Publication US 2024/0146296 A1, May 2, 2024
Int. Cl. G01R 31/26 (2020.01); G01R 31/327 (2006.01); H03K 17/18 (2006.01)
CPC H03K 17/18 (2013.01) [G01R 31/2621 (2013.01); G01R 31/327 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A system for identifying a non-switching semiconductor switch, wherein the system has:
a first acquisition component which is configured to acquire a profile of an electrical variable of a first semiconductor switch controlled by means of a first control signal;
a second acquisition component which is configured to acquire a profile of an electrical variable of a second semiconductor switch controlled by means of a second control signal and connected in parallel with the first semiconductor switch;
a determination unit which is configured to use the profile of the electrical variable of the first semiconductor switch and the profile of the electrical variable of the second semiconductor switch as a basis for determining an output signal which allows a non-switching semiconductor switch of the first semiconductor switch and/or of the second semiconductor switch to be identified,
wherein the first acquisition component has a first measuring amplifier or is in the form of a first measuring amplifier, wherein the first measuring amplifier is configured, for example, to determine as the profile of the electrical variable of the first semiconductor switch a profile of an electric current through a first current sense resistor connected in series with the first semiconductor switch, and/or
wherein the second acquisition component has a second measuring amplifier or is in the form of a second measuring amplifier, wherein the second measuring amplifier is configured, for example, to determine as the profile of the electrical variable of the second semiconductor switch a profile of an electric current through a second current sense resistor connected in series with the second semiconductor switch.