CPC H01L 23/562 (2013.01) [H01L 21/76816 (2013.01); H01L 21/76831 (2013.01); H01L 21/76877 (2013.01); H01L 21/76895 (2013.01); H01L 23/5226 (2013.01); H01L 23/5283 (2013.01); H01L 23/535 (2013.01); H10B 41/27 (2023.02); H10B 41/35 (2023.02); H10B 41/41 (2023.02); H10B 43/27 (2023.02); H10B 43/35 (2023.02); H10B 43/40 (2023.02); H01L 2221/1063 (2013.01)] | 20 Claims |
1. A microelectronic device, comprising:
a stack structure comprising vertically repeated tiers individually comprising at least one conductive material and at least one insulative material, the stack structure defining at least one staircase structure with steps along horizontal edges of the tiers;
a polysilicon fill material substantially filling a volume above the at least one staircase structure, the polysilicon fill material substantially forming to the steps of the at least one staircase structure; and
a dielectric material between the polysilicon fill material and the at least one staircase structure.
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