| CPC H01L 23/49822 (2013.01) [H01L 21/4857 (2013.01); H01L 21/486 (2013.01); H01L 23/49827 (2013.01); H01L 23/49833 (2013.01); H01L 28/40 (2013.01)] | 20 Claims |

|
1. An integrated circuit (IC) package, comprising:
a package substrate comprising a plurality of package substrate interconnects;
an IC chip comprising a plurality of die interconnects;
a redistribution layer (RDL) substrate disposed between the package substrate and the IC chip, the RDL substrate comprising:
a first RDL layer comprising one or more first RDL interconnects each coupled to a first die interconnect among the plurality of die interconnects; and
a second RDL layer comprising one or more second RDL interconnects each coupled to a package substrate interconnect of the plurality of package substrate interconnects;
a dielectric layer disposed between the first RDL layer and the second RDL layer; and
a capacitor package embedded in the dielectric layer, the capacitor package comprising a capacitor;
the dielectric layer comprising:
one or more first vias each coupled to a first RDL interconnect of the one or more first RDL interconnects; and
one or more second vias that extend through the dielectric layer and are disposed through the capacitor package and each coupled to a first RDL interconnect of the one or more first RDL interconnects, and each coupled to a second RDL interconnect of the one or more second RDL interconnects; and
a molding on the IC chip, the RDL substrate, and the package substrate.
|