US 12,217,996 B2
Conveying device
Jin Li, Tokyo (JP); Hiroshi Kikuchi, Tokyo (JP); and Satoshi Enokido, Tokyo (JP)
Assigned to SHINKAWA LTD., Tokyo (JP)
Appl. No. 17/603,934
Filed by SHINKAWA LTD., Tokyo (JP)
PCT Filed Apr. 13, 2020, PCT No. PCT/JP2020/016291
§ 371(c)(1), (2) Date Oct. 14, 2021,
PCT Pub. No. WO2020/213566, PCT Pub. Date Oct. 22, 2020.
Claims priority of application No. 2019-076885 (JP), filed on Apr. 15, 2019.
Prior Publication US 2022/0216089 A1, Jul. 7, 2022
Int. Cl. H01L 21/683 (2006.01); H01L 21/677 (2006.01)
CPC H01L 21/6838 (2013.01) [H01L 21/677 (2013.01)] 5 Claims
OG exemplary drawing
 
1. A conveying device, comprising:
a chuck part configured to hold an object, which is a semiconductor chip or a semiconductor wafer, in a non-contact manner to face a holding surface; and
guide parts having a plurality of guide probes that are columnar and capable of abutting a side surface of the object at intervals and, for the object held by the chuck part, the guide probes limiting movement of the object in a lateral direction that intersects a direction of a normal of the holding surface,
wherein each of the guide probes is capable of performing reciprocating movement in which a tip of corresponding one of the guide probes expands and contracts with respect to the holding surface,
the guide probes comprise a first guide probe provided on a guide part and extending in a direction inclined with respect to the direction of the normal, and a second guide probe provided on another guide part and extending in a direction inclined with respect to the direction of the normal,
a separation width between a tip of the first guide probe and a tip of the second guide probe is larger than a separation width between a base end of the first guide probe and a base end of the second guide probe, and
the tip of the first guide probe and the tip of the second guide probe are rounded.