US 12,217,803 B2
Determine optimized read voltage via identification of distribution shape of signal and noise characteristics
Abdelhakim S. Alhussien, San Jose, CA (US); James Fitzpatrick, Laguna Niguel, CA (US); Patrick Robert Khayat, San Diego, CA (US); and Sivagnanam Parthasarathy, Carlsbad, CA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on May 11, 2022, as Appl. No. 17/742,345.
Application 17/742,345 is a continuation of application No. 16/988,330, filed on Aug. 7, 2020, granted, now 11,355,203.
Prior Publication US 2022/0270686 A1, Aug. 25, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G11C 16/26 (2006.01); G11C 11/56 (2006.01); G11C 29/50 (2006.01)
CPC G11C 16/26 (2013.01) [G11C 11/5642 (2013.01); G11C 29/50 (2013.01); G11C 2029/5004 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A device, comprising:
memory cells;
a calibration circuit; and
a logic circuit configured to:
measure, using the calibration circuit, signal and noise characteristics of the memory cells; and
process the signal and noise characteristics measured for the memory cells to obtain data representative of a count difference curve over a plurality of voltages;
determine, from the data, whether there is a change in concavity of two portions of the count difference curve over the plurality of voltages; and
determine a type of a shape based on concavity of the two portions of the count difference curve over the plurality of voltages.