CPC G11C 11/4096 (2013.01) [G11C 11/4076 (2013.01); G11C 11/4091 (2013.01); G11C 11/4094 (2013.01); G11C 11/4099 (2013.01)] | 20 Claims |
1. A memory circuit comprising:
a set of memory cells configured to store data; and
a local input output (LIO) circuit coupled to a global bit line and the set of memory cells, the LIO circuit comprising:
a sense amplifier configured to sense a first signal in response to at least a sense amplifier signal, the first signal corresponding to a value of the data stored in the set of memory cells;
a driver circuit configured to generate a global bit line signal in response to at least the first signal or an inverted first signal; and
a booster circuit coupled to the driver circuit and the global bit line, and configured to adjust the global bit line signal in response to a delayed global bit line signal, wherein the booster circuit comprises:
a first inverter configured to generate a second signal in response to the global bit line signal, the first inverter including a first input terminal coupled to the global bit line, and a first output terminal;
a delay circuit coupled to the first output terminal of the first inverter, and configured to generate a delayed second signal in response to the second signal; and
a second inverter configured to generate a third signal in response to the delayed second signal, the second inverter including a second input terminal and a second output terminal, the second input terminal being coupled to an output terminal of the delay circuit, the third signal corresponds to the delayed global bit line signal.
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