US 12,217,721 B2
Mura inspection device for compressing mura data through dimensionality reduction, operating method, and display system including the same
Pil-Seung Heo, Seoul (KR); and Se Whan Na, Seoul (KR)
Assigned to Samsung Electronics Co., Ltd., (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Sep. 27, 2022, as Appl. No. 17/953,624.
Claims priority of application No. 10-2021-0154970 (KR), filed on Nov. 11, 2021; and application No. 10-2022-0017814 (KR), filed on Feb. 10, 2022.
Prior Publication US 2023/0148119 A1, May 11, 2023
Int. Cl. G09G 5/00 (2006.01)
CPC G09G 5/003 (2013.01) [G09G 2300/0465 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/029 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A mura inspection device comprising:
an optical meter configured to measure luminance of a display region and generate a first luminance matrix;
a luminance preprocessor configured to detect a distortion region of the display region in relation to the first luminance matrix, and generate a second luminance matrix by adjusting luminance of the distortion region;
a mura generator configured to generate a mura matrix in relation to a difference between the second luminance matrix and a reference value; and
an encoder configured to generate encoding data by applying dimensionality reduction to the mura matrix,
wherein the first luminance matrix includes a plurality of first elements respectively having a plurality of raw luminance values, and the luminance preprocessor is further configured to identify a first element among the plurality of first elements as a distorted element of the first luminance matrix corresponding to the distortion region, the identified first element having a raw luminance value less than a first luminance value,
wherein when the raw luminance value of the distorted element is greater than or equal to a second luminance value less than the first luminance value, the luminance preprocessor is further configured to
calculate an average luminance value of a column including the distorted element,
calculate a convergence luminance value of the plurality of first elements, and
determine a pre-processed luminance value corresponding to a distorted element in the second luminance matrix in relation to a difference between the average luminance value and the convergence luminance value, and
wherein the distorted element in the second luminance matrix corresponds to the distorted element of the first luminance matrix.