US 12,217,495 B2
Learning process device and inspection device
Ken Wada, Tokyo (JP)
Assigned to Syntegon Technology K.K., Tokyo (JP)
Appl. No. 17/642,423
Filed by SYNTEGON TECHNOLOGY K.K., Tokyo (JP)
PCT Filed Sep. 16, 2020, PCT No. PCT/JP2020/035141
§ 371(c)(1), (2) Date Mar. 11, 2022,
PCT Pub. No. WO2021/054376, PCT Pub. Date Mar. 25, 2021.
Claims priority of application No. 2019-168127 (KE), filed on Sep. 17, 2019.
Prior Publication US 2022/0343640 A1, Oct. 27, 2022
Int. Cl. G06V 10/82 (2022.01); G06T 7/00 (2017.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01)
CPC G06V 10/82 (2022.01) [G06T 7/0004 (2013.01); G06V 10/7747 (2022.01); G06V 10/776 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01)] 4 Claims
OG exemplary drawing
 
1. A learning processing apparatus for constructing a neural network model for use in inspection of an inspection target based on image data obtained by capturing an image of the inspection target and the neural network model,
the learning processing apparatus comprising:
a learning unit configured to execute learning processing under predetermined learning conditions based on a list of image data including a plurality of learning images to construct a neural network model,
wherein the learning unit is configured to assign, when the list of image data or the learning conditions is at least partially changed, unique model identification data to a combination of the list of image data and the learning conditions in which the list of image data or learning conditions is changed and embed the unique model identification data with respect to a neural network model constructed with the list of image data and the learning conditions, thereby embedding unique model identification data in the neural network model, each time the learning unit constructs the neural network model.