US 12,216,915 B2
Adaptive read disturb scan
Animesh R. Chowdhury, Boise, ID (US); Kishore K. Muchherla, San Jose, CA (US); Nicola Ciocchini, Boise, ID (US); Akira Goda, Setagaya (JP); Jung Sheng Hoei, Newark, CA (US); Niccolo′ Righetti, Boise, ID (US); and Jonathan S. Parry, Boise, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Oct. 17, 2022, as Appl. No. 17/967,265.
Prior Publication US 2024/0126448 A1, Apr. 18, 2024
Int. Cl. G06F 3/06 (2006.01)
CPC G06F 3/0619 (2013.01) [G06F 3/0653 (2013.01); G06F 3/0679 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method, comprising:
determining a delay between a first read command and a second read command;
incrementing a read count based on the determined delay between the first read command and the second read command; and
adapting a read disturb scan rate based on the incremented read count.