US 12,216,558 B2
Test and measurement system for analyzing devices under test
Sam J. Strickling, Portland, OR (US); Daniel S. Froelich, Portland, OR (US); Michelle L. Baldwin, Mount Juliet, TN (US); Jonathan San, Palo Alto, CA (US); and Lin-Yung Chen, New Taipei (TW)
Assigned to Tektronix, Inc., Beaverton, OR (US)
Filed by Tektronix, Inc., Beaverton, OR (US)
Filed on Sep. 14, 2023, as Appl. No. 18/467,597.
Application 18/467,597 is a continuation of application No. 17/359,261, filed on Jun. 25, 2021, granted, now 11,782,809.
Claims priority of provisional application 63/046,595, filed on Jun. 30, 2020.
Prior Publication US 2024/0004768 A1, Jan. 4, 2024
Int. Cl. G06F 11/26 (2006.01); G06F 11/24 (2006.01)
CPC G06F 11/26 (2013.01) [G06F 11/24 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A test and measurement system, comprising:
a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results;
a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test;
a data analyzer connected to the test and measurement instrument through the one or more communications links, the data analyzer configured to analyze the new test results based on the stored test results; and
a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.