US 12,216,184 B2
Automated inspection for internal corrosion
Andrew DeBiccari, Hartford, CT (US); and Zhong Ouyang, Glastonbury, CT (US)
Assigned to RTX Corporation, Farmington, CT (US)
Filed by Raytheon Technologies Corporation, Farmington, CT (US)
Filed on May 2, 2023, as Appl. No. 18/310,937.
Application 18/310,937 is a continuation of application No. 16/948,029, filed on Aug. 27, 2020, granted, now 11,668,773.
Application 16/948,029 is a continuation in part of application No. 16/361,303, filed on Mar. 22, 2019, granted, now 11,002,638, issued on Apr. 21, 2021.
Prior Publication US 2023/0273277 A1, Aug. 31, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G01R 33/12 (2006.01); G01M 15/14 (2006.01); G01N 27/87 (2006.01)
CPC G01R 33/1223 (2013.01) [G01M 15/14 (2013.01); G01N 27/87 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A system for magnetically inspecting a metallic component having a surface, the system comprising:
a holder configured to hold the metallic component
a probe fixture configured to hold a magnetic probe having a probe tip aligned with a probe axis, the magnetic probe configured to measure a magnetic permeability of the metallic component;
a manipulator configured to manipulate a relative position between the holder and the probe fixture to put the probe tip in contact with the metallic component;
a controller configured to:
control the manipulator to trace an inspection route upon the surface of the metallic component along which the probe tip contacts the metallic component such that an angular difference between the probe axis and a surface tangent plane of the metallic component is 90±10 degrees; and
receive the magnetic permeability of the metallic component measured by the magnetic probe along the inspection route;
a mechanical biasing component, wherein the mechanical biasing component comprises a mechanically compressible component that is configured to maintain contact between the probe tip and the metallic component; and
a force transducer configured to produce a contact force signal that is indicative of a contact force between the probe tip and the metallic component.