US 12,216,151 B2
Measurement instrument, measurement system, and testing method of testing a device under test
Paul Gareth Lloyd, Munich (DE); and Markus Loerner, Munich (DE)
Assigned to Rohde & Schwarz GmbH & Co. KG, Munich (DE)
Filed by Rohde & Schwarz GmbH & Co. KG, Munich (DE)
Filed on Apr. 25, 2023, as Appl. No. 18/306,829.
Prior Publication US 2024/0361377 A1, Oct. 31, 2024
Int. Cl. G01R 31/28 (2006.01)
CPC G01R 31/2841 (2013.01) [G01R 31/2837 (2013.01)] 21 Claims
OG exemplary drawing
 
1. A measurement instrument for testing a device under test, the measurement instrument comprising:
a common port configured to be connectable to a signal output of the device under test, wherein the common port is configured to receive a forward-travelling signal from the device under test;
a signal line connected to the common port; and
a signal processing circuit, wherein the signal processing circuit comprises a signal analysis circuit and a signal generator circuit,
wherein the signal analysis circuit is connected with the common port so as to receive the forward-travelling signal from the common port,
wherein the signal analysis circuit is configured to analyze the forward-travelling signal in order to assess a performance of the device under test,
wherein the signal generator circuit is connected to the signal line, wherein the signal generator circuit is configured to generate a backward-travelling signal that is forwarded to the common port,
wherein the signal generator circuit comprises a reference signal input, the reference signal input being configured to receive a reference signal from a reference signal generator, and
wherein the signal generator circuit is configured to generate the backward-travelling signal based on the reference signal.