US 12,216,144 B2
Electronic device having a testing method for determining defects in a sensor layer
Eunsol Seo, Yongin-si (KR); Hyun-Wook Cho, Yongin-si (KR); Sangkook Kim, Yongin-si (KR); Taejoon Kim, Yongin-si (KR); Eungkwan Lee, Yongin-si (KR); and Jaewoo Choi, Yongin-si (KR)
Assigned to Samsung Display Co., Ltd., Yongin-si (KR)
Filed by Samsung Display Co., Ltd., Yongin-si (KR)
Filed on Jun. 23, 2023, as Appl. No. 18/340,678.
Claims priority of application No. 10-2022-0101366 (KR), filed on Aug. 12, 2022.
Prior Publication US 2024/0053392 A1, Feb. 15, 2024
Int. Cl. G01R 27/26 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01)
CPC G01R 27/2605 (2013.01) [G06F 3/04166 (2019.05); G06F 3/0443 (2019.05); G06F 3/0446 (2019.05)] 19 Claims
OG exemplary drawing
 
1. A method for testing an electronic device, the method comprising:
providing the electronic device including a display layer and a sensor layer on the display layer and configured to operate at a touch drive frequency, the sensor layer including a plurality of first electrodes and a plurality of second electrodes insulatively intersecting the plurality of first electrodes;
providing a test signal having a test frequency higher than the touch drive frequency to the plurality of first electrodes;
measuring mutual capacitance with the plurality of first electrodes through the plurality of second electrodes by measuring a first mutual capacitance from one second electrode among the plurality of second electrodes and to measure a second mutual capacitance from another second electrode among the plurality of second electrodes; and
determining whether or not the sensor layer is defective based on the first mutual capacitance and the second mutual capacitance.