US 12,216,139 B2
Adaptive flexible chip test socket and formation method thereof
Zhe Lian, Suzhou (CN); Jianjun Huang, Suzhou (CN); Yonghong Wu, Suzhou (CN); Shan Zhao, Suzhou (CN); and Haiyang Hu, Suzhou (CN)
Assigned to SEMIGHT INSTRUMENTS CO., LTD, Suzhou (CN)
Filed by SEMIGHT INSTRUMENTS CO., LTD, Suzhou (CN)
Filed on Feb. 5, 2024, as Appl. No. 18/432,932.
Application 18/432,932 is a continuation of application No. PCT/CN2023/134144, filed on Nov. 24, 2023.
Claims priority of application No. 202310661566.8 (CN), filed on Jun. 6, 2023.
Prior Publication US 2024/0410917 A1, Dec. 12, 2024
Int. Cl. G01R 1/04 (2006.01); G01R 1/02 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 3/00 (2006.01); G01R 31/26 (2020.01); G01R 31/28 (2006.01)
CPC G01R 1/0441 (2013.01) [G01R 3/00 (2013.01); G01R 31/2886 (2013.01)] 10 Claims
OG exemplary drawing
 
1. An adaptive die test socket, comprising:
an upper test socket and a lower test socket disposed directly below the upper test socket, wherein the upper test socket and the lower test socket are capable of moving relative to each other along a vertical direction; and a groove is formed at a lower surface of the upper test socket and/or at an upper surface of the lower test socket, such that an accommodating chamber for placing a die to-be-tested is formed between the upper test socket and the lower test socket at a mold-closed state, wherein:
the upper test socket is connected to a support frame through an installation plate disposed above the upper test socket, wherein the support frame is capable of moving along a vertical direction; a strip-shaped through hole is formed on an upper surface of the support frame; a first protruding strip is at each of lower portions of two opposite inner walls of the strip-shaped through hole; a corresponding second protruding strip extending directly above the first protruding strip is at each of upper portions of two opposite side surfaces of the installation plate; a strip-shaped block is disposed above each second protruding strip; and a side of the strip-shaped block is fixedly connected to the upper surface of the support frame, and another side of the strip-shaped block extends to directly above the second protruding strip and is connected to the second protruding strip through at least two springs;
when the upper test socket and the lower test socket are at a mold-opening state, a lower surface of the second protruding is adjoined to be in a contact with an upper surface of a corresponding first protruding strip; and
when the upper test socket and the lower test socket are at the mold-closed state, the lower surface of the upper test socket is tightly attached to the upper surface of the lower test socket, and a gap is formed between the lower surface of the second protruding strip and the upper surface of the first protruding strip.