US 12,216,086 B2
Multiplexing readout circuit and method for electromagnetic inspection array probe
Francis Jeanson, Québec (CA); and Florian Hardy, Québec (CA)
Assigned to EDDYFI CANADA INC., Québec (CA)
Filed by Eddyfi Canada Inc., Québec (CA)
Filed on Dec. 7, 2022, as Appl. No. 18/076,540.
Claims priority of provisional application 63/265,103, filed on Dec. 8, 2021.
Prior Publication US 2023/0176013 A1, Jun. 8, 2023
Int. Cl. G01N 27/90 (2021.01)
CPC G01N 27/9006 (2013.01) 20 Claims
OG exemplary drawing
 
1. A readout circuit for an electromagnetic inspection system for nondestructive testing of a test object, the electromagnetic inspection system comprising a plurality of sensors configured to sense an electromagnetic response from the test object and generate a respective plurality of response signals from the sensed electromagnetic response, the readout circuit comprising:
a plurality of anti-aliasing filters, each anti-aliasing filter being configured to receive the response signal from a respective one of the sensors and to bandlimit the respective response signal to produce a respective one of a plurality of bandlimited signals; and
a time-division multiplexer coupled to the plurality of anti-aliasing filters and configured to multiplex the plurality of bandlimited signals into a time-division multiplexed (TDM) signal, the TDM signal comprising a sequence of frames outputted at a TDM frame rate, each frame comprising a plurality of time slots, each time slot being assigned to a respective one of the plurality of bandlimited signals,
wherein the plurality of anti-aliasing filters is configured to operate based on the TDM frame rate to attenuate aliasing artifacts in the TDM signal.