US 12,216,043 B2
Devices and methods for determining chiral optical properties from third harmonic Mie scattering of semiconductor nanohelices
Nicholas A. Kotov, Ypsilanti, MI (US); Ventsislav Valev, Bath (GB); Lukas Ohnoutek, Zlin (CZ); and Ji-Young Kim, Ann Arbor, MI (US)
Assigned to The Regents of The University of Michigan, Ann Arbor, MI (US); and University of Bath, Bath (GB)
Appl. No. 18/715,339
Filed by The Regents of The University of Michigan, Ann Arbor, MI (US); and University of Bath, Bath (GB)
PCT Filed Dec. 1, 2022, PCT No. PCT/US2022/051531
§ 371(c)(1), (2) Date May 31, 2024,
PCT Pub. No. WO2023/102112, PCT Pub. Date Jun. 8, 2023.
Claims priority of provisional application 63/284,813, filed on Dec. 1, 2021.
Prior Publication US 2024/0418632 A1, Dec. 19, 2024
Int. Cl. G01N 21/21 (2006.01); G01N 21/19 (2006.01); G01N 21/47 (2006.01)
CPC G01N 21/21 (2013.01) [G01N 21/19 (2013.01); G01N 21/47 (2013.01); G01N 2021/216 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method of detecting chiral properties from a sample, the method comprising:
directing light towards a sample in contact with a chiral nanoparticle; and
detecting third harmonic Mie scattering (THMS) optical activity generated by the chiral nanoparticle in contact with the sample.