US 12,216,008 B2
Arrangement and method for calibrating temperature sensors
Hilco Suy, AE Eindhoven (NL); Frans De Jong, AE Eindhoven (NL); Agata Sakic, AE Eindhoven (NL); Nebojsa Nenadovic, AE Eindhoven (NL); Geert Calaerts, AE Eindhoven (NL); Hans Ten Cate, AE Eindhoven (NL); Renie De Kok, AE Eindhoven (NL); and Andreis Valter, AE Eindhoven (NL)
Assigned to SCIOSENSE B.V., AE Eindhoven (NL)
Filed by Sciosense B.V., AE Eindhoven (NL)
Filed on Nov. 30, 2023, as Appl. No. 18/524,740.
Application 18/524,740 is a continuation of application No. 16/975,936, granted, now 11,885,692, previously published as PCT/EP2019/054725, filed on Feb. 26, 2019.
Prior Publication US 2024/0094070 A1, Mar. 21, 2024
Int. Cl. G01K 15/00 (2006.01); G01R 31/69 (2020.01); G01K 5/28 (2006.01)
CPC G01K 15/005 (2013.01) [G01R 31/69 (2020.01); G01K 5/28 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A method for calibrating temperature sensors, the method comprising arranging devices-under-test (DUTs) in a sealable and thermally isolated chamber of a calibration arrangement such that each of the DUTs is in proximity to, associated to and in thermal contact with at least one of a number of reference samples;
controlling the calibration arrangement to thermalize the DUTs and the reference samples to a temperature set point; and
generating, based on a temperature-dependent quantity, a set of measurement signals for each of the DUTs, with each set of measurement signals comprising:
a test measurement signal from a distinct one of the DUTs; and
a reference measurement signal from each of an associated at least one of the reference samples.