US 12,213,828 B2
Image data inspection method and apparatus, computer device, and storage medium
Shilei Cao, Shenzhen (CN); Hualuo Liu, Shenzhen (CN); and Yefeng Zheng, Shenzhen (CN)
Assigned to TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED, Shenzhen (CN)
Filed by TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED, Shenzhen (CN)
Filed on Apr. 15, 2022, as Appl. No. 17/721,806.
Application 17/721,806 is a continuation of application No. PCT/CN2021/081206, filed on Mar. 17, 2021.
Claims priority of application No. 202010367441.0 (CN), filed on Apr. 30, 2020.
Prior Publication US 2022/0233160 A1, Jul. 28, 2022
Int. Cl. A61B 6/00 (2024.01); A61B 6/03 (2006.01); G06T 7/00 (2017.01); G06V 10/10 (2022.01); G06V 10/24 (2022.01); G06V 10/77 (2022.01); G06V 10/774 (2022.01)
CPC A61B 6/5241 (2013.01) [A61B 6/032 (2013.01); G06T 7/0012 (2013.01); G06V 10/16 (2022.01); G06V 10/24 (2022.01); G06V 10/7715 (2022.01); G06V 10/774 (2022.01); G06T 2207/10081 (2013.01); G06T 2207/30061 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An image data inspection method, performed by a computer, the method comprising:
obtaining an image to be inspected, the image to be inspected comprising a sequence of slice images;
determining a corresponding group of slice images for each target image in the sequence of slice images, the group of slice images comprising the target image and an adjacent image having a context relationship with the target image in the sequence of slice images;
extracting a corresponding slice feature map for each slice image in the group of slice images;
aligning the slice feature maps extracted corresponding to the group of slice images;
aggregating context information of each slice image in the group of slice images by using an aligned feature map; and
performing target region inspection on an aggregated feature map, to obtain an inspection result corresponding to the target image, and combining the inspection result corresponding to each target image, to generate an inspection result corresponding to the image to be inspected.