US 12,213,735 B2
Eye examination attachment, control device, and ophthalmic microscope system
Yoshio Soma, Tokyo (JP); Tomoyuki Ootsuki, Tokyo (JP); and Junichiro Enoki, Tokyo (JP)
Assigned to SONY GROUP CORPORATION, Tokyo (JP)
Appl. No. 17/593,097
Filed by SONY GROUP CORPORATION, Tokyo (JP)
PCT Filed Mar. 12, 2020, PCT No. PCT/JP2020/010690
§ 371(c)(1), (2) Date Sep. 9, 2021,
PCT Pub. No. WO2020/195865, PCT Pub. Date Oct. 1, 2020.
Claims priority of application No. 2019-058159 (JP), filed on Mar. 26, 2019.
Prior Publication US 2022/0175245 A1, Jun. 9, 2022
Int. Cl. A61B 3/13 (2006.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01); G06T 5/80 (2024.01); H04N 9/64 (2023.01); H04N 13/296 (2018.01)
CPC A61B 3/13 (2013.01) [A61B 3/0041 (2013.01); A61B 3/14 (2013.01); G06T 5/80 (2024.01); H04N 9/646 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30041 (2013.01); H04N 13/296 (2018.05)] 21 Claims
OG exemplary drawing
 
1. An eye examination attachment, comprising:
a joining unit configured to join with an ophthalmic microscope;
a front optical system coupled to the joining unit, wherein the front optical system includes a front lens configured for placement in front of an eye; and
a communication unit configured to send information regarding the front optical system to an external device.