CPC H10B 61/20 (2023.02) [G11C 11/1659 (2013.01); G11C 11/1673 (2013.01); H10N 50/10 (2023.02)] | 20 Claims |
1. A magnetic junction memory device comprising:
a first single-transistor common-gate amplifier circuit including a first transistor which is gated by a gating voltage and has a first end connected to a first sensing node, the first single-transistor common-gate amplifier circuit configured to determine a voltage of the first sensing node by applying a first read current to a first reference resistor;
a second single-transistor common-gate amplifier circuit including a second transistor which is gated by the gating voltage and has a first end connected to a second sensing node, the second single-transistor common-gate amplifier circuit configured to determine a voltage of the second sensing node by applying a second read current to a second reference resistor, which has a different resistance from the first reference resistor; and
a third single-transistor common-gate amplifier circuit including a third transistor which is gated by the gating voltage and has a first end connected to a third sensing node, the third single-transistor common-gate amplifier circuit configured to determine a voltage of the third sensing node by applying a third read current to a magnetic junction memory cell.
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