US 11,887,831 B2
Automated ion optics charging compensation
Leigh Bedford, Ajax (CA); Yang Kang, Richmond Hill (CA); Yves Le Blanc, Newmarket (CA); and Bradley Schneider, Bradford (CA)
Assigned to DH Technologies Development Pte. Ltd., Singapore (SG)
Appl. No. 17/312,695
Filed by DH Technologies Development Pte. Ltd., Singapore (SG)
PCT Filed Dec. 12, 2019, PCT No. PCT/IB2019/060728
§ 371(c)(1), (2) Date Jun. 10, 2021,
PCT Pub. No. WO2020/121256, PCT Pub. Date Jun. 18, 2020.
Claims priority of provisional application 62/779,301, filed on Dec. 13, 2018.
Prior Publication US 2022/0059334 A1, Feb. 24, 2022
Int. Cl. H01J 49/06 (2006.01); H01J 49/00 (2006.01); H01J 49/42 (2006.01)
CPC H01J 49/067 (2013.01) [H01J 49/0031 (2013.01); H01J 49/4215 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A method for optimizing performance of a mass spectrometer, comprising:
using an ion source to generate ions,
collisionally cooling said ions within an ion guide,
directing said ions from the ion guide through at least one ion lens to a downstream mass analyzer,
ramping a DC voltage applied to said ion lens,
performing mass analysis of said ions within said mass analyzer while the DC voltage applied to the ion lens is ramped,
estimating performance of the mass spectrometer by measuring one or more characteristics of at least one of an ion signal and the voltage ramp in response to ramping of the DC voltage,
adjusting a DC voltage applied to said at least one lens element based on said measured one or more characteristics of the at least one of an ion intensity signal and said voltage ramp so as to enhance performance of the mass spectrometer.