US 11,887,389 B2
Inspection apparatus, inspection method, and non-transitory computer-readable storage medium
Kazufumi Kobashi, Tokyo (JP)
Assigned to Canon Kabushiki Kaisha, Tokyo (JP)
Filed by CANON KABUSHIKI KAISHA, Tokyo (JP)
Filed on Feb. 3, 2021, as Appl. No. 17/166,168.
Claims priority of application No. 2020-025401 (JP), filed on Feb. 18, 2020.
Prior Publication US 2021/0256677 A1, Aug. 19, 2021
Int. Cl. G06V 30/40 (2022.01); G06T 7/00 (2017.01); G06V 10/98 (2022.01)
CPC G06V 30/40 (2022.01) [G06T 7/001 (2013.01); G06V 10/98 (2022.01); G06T 2207/20104 (2013.01); G06T 2207/30144 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An inspection apparatus comprising:
at least one of (a) one or more processors and a storage medium and (b) circuitry, the at least one of (a) one or more processors and a storage medium and (b) circuitry being configured to act as a plurality of units comprising:
(1) a first obtaining unit configured to obtain a plurality of reference images;
(2) a second obtaining unit configured to obtain an inspection target image;
(3) a setting unit configured to set, for at least one reference image among the plurality of reference images, an inspection region to be inspected; and
(4) an inspection unit configured to inspect the inspection target image based on a result of comparison of the inspection target image and the reference image in which the inspection region is set,
wherein the setting unit comprises: (a) a first setting unit configured to set the inspection region for a first reference image selected from the plurality of reference images; and (b) a second setting unit configured to set, for a second reference image which is selected from the plurality of reference images and which is different from the first reference image, the inspection region in a case where the second reference image is an image satisfying a predetermined condition.