CPC G06F 3/0611 (2013.01) [G06F 3/0653 (2013.01); G06F 3/0679 (2013.01)] | 20 Claims |
1. A method comprising:
responsive to determining that predetermined number of program erase cycles (PECs) of a memory device has occurred, identifying a target block family of a plurality of block families of the memory device, wherein each block family comprises a plurality of blocks;
obtaining respective temporal voltage shifts of a subset of blocks of the target block family from a plurality of dies associated with the target block family;
obtaining, based on an average of the respective temporal voltage shifts of the subset of blocks, respective die measurements for the plurality of dies; and
assigning, based on the respective die measurements, the plurality of dies to respective die families of a plurality of consecutive die families.
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