US 11,885,767 B2
Automated scan data quality assessment in ultrasonic testing
Bruno Abreu Calfa, Vernon, CT (US); Mahmoud El Chamie, Rocky Hill, CT (US); Amit Surana, Newington, CT (US); and Ozgur Erdinc, Mansfield, CT (US)
Assigned to RTX Corporation, Farmington, CT (US)
Filed by Raytheon Technologies Corporation, Farmington, CT (US)
Filed on Jun. 21, 2021, as Appl. No. 17/352,957.
Prior Publication US 2022/0404317 A1, Dec. 22, 2022
Int. Cl. G01N 29/04 (2006.01); G01N 29/34 (2006.01); G01N 29/44 (2006.01)
CPC G01N 29/048 (2013.01) [G01N 29/043 (2013.01); G01N 29/343 (2013.01); G01N 29/4445 (2013.01); G01N 29/4481 (2013.01); G01N 2291/102 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system for detecting a sub-surface defect comprising:
a transducer fluidly coupled to a part located in a tank containing a liquid configured to transmit ultrasonic energy, said transducer configured to scan said part to create scan data of the scanned part;
a pulser/receiver coupled to said transducer configured to receive and transmit said scan data;
a processor coupled to said pulser/receiver, said processor configured to communicate with said pulser/receiver and collect said scan data; and said processor configured to detect said sub-surface defect;
a tangible, non-transitory memory configured to communicate with said processor, the tangible, non-transitory memory having instructions stored therein that, in response to execution by the processor, cause the processor to perform operations comprising:
receiving, by the processor, said scan data for said part from said transducer;
collecting, by the processor, the scan data;
determining, by the processor, a defect indication in the scan data that indicates a distractor, wherein said indication is based on a learning phase module and an inference phase module that the processor uses to self-assess said indication; and
creating, by the processor, a defect indication report.