US 11,885,755 B2
X-ray sequential array wavelength dispersive spectrometer
Wenbing Yun, Walnut Creek, CA (US); Ruimin Qiao, Berkeley, CA (US); Sylvia Jia Yun Lewis, San Francisco, CA (US); Srivatsan Seshadri, Pleasanton, CA (US); Janos Kirz, Berkeley, CA (US); and Benjamin Donald Stripe, Berkeley, CA (US)
Assigned to Sigray, Inc., Concord, CA (US)
Filed by Sigray, Inc., Concord, CA (US)
Filed on Apr. 28, 2023, as Appl. No. 18/309,021.
Claims priority of provisional application 63/337,407, filed on May 2, 2022.
Prior Publication US 2023/0349842 A1, Nov. 2, 2023
Int. Cl. G01N 23/207 (2018.01); G01N 23/20008 (2018.01); G01N 23/085 (2018.01); G01N 23/2209 (2018.01)
CPC G01N 23/2076 (2013.01) [G01N 23/085 (2018.02); G01N 23/20008 (2013.01); G01N 23/2209 (2018.02); G01N 2223/041 (2013.01); G01N 2223/0568 (2013.01); G01N 2223/076 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/316 (2013.01); G01N 2223/32 (2013.01); G01N 2223/50 (2013.01); G01N 2223/652 (2013.01)] 31 Claims
OG exemplary drawing
 
1. An apparatus configured to receive x-rays propagating from an x-ray source along an x-ray propagation direction, the apparatus comprising:
a plurality of x-ray diffractors along the x-ray propagation direction, the plurality of x-ray diffractors comprising at least a first x-ray diffractor and a second x-ray diffractor, the second x-ray diffractor downstream from the first x-ray diffractor; and
a plurality of x-ray detectors comprising at least a first x-ray detector and a second x-ray detector,
the first x-ray diffractor configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor,
the second x-ray diffractor configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector,
the first x-ray detector comprising at least one first active element configured to measure a first spectrum of at least a portion of the first spectral band of the x-rays and the second x-ray detector comprising at least one second active element configured to measure a second spectrum of at least a portion of the second spectral band of the x-rays.