US 11,885,692 B2
Arrangement and method for calibrating temperature sensors
Hilco Suy, AE Eindhoven (NL); Frans De Jong, AE Eindhoven (NL); Agata Sakic, AE Eindhoven (NL); Nebojsa Nenadovic, AE Eindhoven (NL); Geert Calaerts, AE Eindhoven (NL); Hans Ten Cate, AE Eindhoven (NL); Renie De Kok, AE Eindhoven (NL); and Andreis Valter, AE Eindhoven (NL)
Assigned to Sciosense B.V., AE Eindhoven (NL)
Appl. No. 16/975,936
Filed by SCIOSENSE B.V., AE Eindhoven (NL)
PCT Filed Feb. 26, 2019, PCT No. PCT/EP2019/054725
§ 371(c)(1), (2) Date Aug. 26, 2020,
PCT Pub. No. WO2019/185259, PCT Pub. Date Oct. 3, 2019.
Claims priority of application No. 18163982 (EP), filed on Mar. 26, 2018.
Prior Publication US 2021/0364372 A1, Nov. 25, 2021
Int. Cl. G01K 15/00 (2006.01); G01R 31/69 (2020.01); G01K 5/28 (2006.01)
CPC G01K 15/005 (2013.01) [G01R 31/69 (2020.01); G01K 5/28 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A calibration arrangement for temperature sensors comprising:
a sealable and thermally isolated chamber;
a socket mount comprising:
a number of reference samples with each of the reference samples being in thermal contact with the socket mount; and
a number of sample sockets for devices-under test (DUTs) with each sample socket being arranged in proximity to and associated to at least one of the reference samples;
a circuit board configured to provide electrical connection to the sample sockets and the reference samples in the socket mount; and
a thermal chuck in thermal contact with the socket mount and the circuit board,
wherein the thermal chuck is configured to thermalize the socket mount and the circuit board to a temperature set point, and
wherein the DUTs are the temperature sensors to be calibrated.