LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 28th DAY OF January, 2025
AND TO WHOM
REEXAMINATION CERTIFICATES AND PATENT TRIAL AND APPEAL BOARD CERTIFICATES WERE ISSUED
DURING THE WEEK BEGINNING THE 20th DAY OF January, 2025.
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

U.S. Well Services, LLC: See--
Broussard, Joel N.; McPherson, Jeff; and Kurtz, Robert 12209490 Cl. E21B 43/2607.
Oehring, Jared; Christinzio, Alexander James; and Hinderliter, Brandon N. 12209489 Cl. E21B 43/2607.
Uber Technologies, Inc.: See--
Fernandes, Neil; Singh, Shivendra Pratap; Gabbita, Krishna Aditya; and Somani, Aditya 12213029 Cl. H04W 4/029.
Stegall, Neil; and Zych, Noah 12209874 Cl. G01C 21/3438.
Ubicquia, Inc.: See--
Hutson, Bradford Brian; and Aaron, Ian B. 12212610 Cl. H04L 65/40.
Uchibori, Kenji: See--
Adachi, Hirohisa; Miyazawa, Masaki; and Uchibori, Kenji 12208618 Cl. B41J 2/16511.
UCHICAGO ARGONNE, LLC: See--
Rotsch, David; Nolen, Jr., Jerry A.; Chemerisov, Sergey D.; Bailey, James L; and Kmak, Ronald T. 12208363 Cl. B01D 7/00.
Yu, Wenhua; Singh, Dileep; France, David M.; and Du, Wenchao 12208573 Cl. B29C 64/165.
Uchida, Hirokatsu: See--
Kakutani, Yuzuru; Furubayashi, Yugo; and Uchida, Hirokatsu 12209225 Cl. C10L 3/106.
Uchida, Tetsuya; Hirano, Tomoyuki; and Suzuki, Ryoji, to Sony Semiconductor Solutions Corporation Imaging element having p-type and n-type solid phase diffusion layers formed in a side wall of an interpixel light shielding wall 12211875 Cl. H01L 27/1463.
Uchiho, Takashi; Saito, Yoshinobu; and Ryu, Jonghyun, to DISCO CORPORATION Tape affixing apparatus 12208984 Cl. B65H 37/04.
Uchimura, Yasuhiro; to Kioxia Corporation Semiconductor storage device 12211558 Cl. G11C 16/16.
Uchiyama, Hirotaka: See--
Smith, Christopher Lawrence; Hale, Benjamin Patrick; Burt, Adam James; Hasenoehrl, Erik John; Rossi, Danilo; Pedrotti, Andrea; Sordo, Walter; Giovanelli, Alessio; Floyd, Brian Lee; Uchiyama, Hirotaka; Walker, III, Thomas Bernard; and Clerc, Anthony Xavier Jean-Yves 12207640 Cl. A01M 1/145.
UCL BUSINESS LTD: See--
Nathwani, Amit; and Mcintosh, Jenny 12209262 Cl. C12N 9/644.
Pulé, Martin 12209114 Cl. C07K 14/70596.
Udalov, Oleg: See--
Weinberg, Irving N.; and Udalov, Oleg 12210078 Cl. G01R 33/383.
Udaya, Sahana Durgam; and Kumar, Pranav, to SAP SE Exploratory analysis of content package objects 12210998 Cl. G06Q 10/0833.
UEA ENTERPRISES LIMITED: See--
Hancock, Nicola Joanne; Pomeroy, Valerie Moyra; and Robinson, David Geoffrey 12208048 Cl. A61H 1/0262.
Uecker, James Lee: See--
Zwayer, Jake; Barhorst, Steven; Uecker, James Lee; Hsu, Christopher; Sigl, Dennis; and Patterson, Jon Michael 12208476 Cl. B23K 9/1093.
Ueda, Kensuke; and Matsushima, Nobutaka, to NTT DOCOMO, INC. Information processing apparatus 12211227 Cl. G06T 7/70.
Ueda, Maki: See--
Ohi, Michio; Ueda, Maki; and Mayumi, Hiroki 12211724 Cl. H01L 21/681.
Uehara, Hiroki; to JATCO LTD Power transmission device 12209654 Cl. F16H 57/0483.
Uehara, Hiroshi; to EXEDY Corporation Damper device 12209630 Cl. F16D 7/025.
Uehara, Hiroshi; to EXEDY Corporation Damper device 12209631 Cl. F16D 7/025.
Uematsu, Yutaka: See--
Toyama, Masahiro; Nakamura, Yuki; Uematsu, Yutaka; and Sakamoto, Hideyuki 12213294 Cl. H05K 9/0039.
Uemichi, Yusuke; to Fujikura Ltd. Digital phase shifter 12212029 Cl. H01P 1/184.
Uemura, Hiroshi: See--
Tanaka, Keiji; Uemura, Hiroshi; and Misawa, Taichi 12210231 Cl. G02F 1/0121.
Uemura, Kouichi: See--
Yauchi, Masataka; Uemura, Kouichi; Tsujita, Yukio; Oohashi, Reina; Kumasaki, Shunsuke; and Funashoku, Akihito 12210332 Cl. G05B 19/404.
Uemura, Takashi: See--
Tashiro, Shunsuke; Yu, Shengnan; and Uemura, Takashi 12211674 Cl. H01J 37/32834.
Uemura, Tsutomu: See--
Miwa, Tetsuyuki; Uemura, Tsutomu; and Shimizu, Kazunari 12207880 Cl. A61B 3/165.
Ueno, Kohei: See--
Hashiguchi, Namiki; Ueno, Kohei; Kodaira, Hirohisa; and Kotaka, Toshikazu 12212721 Cl. H04N 1/00639.
Ueno, Kousuke; Tamai, Masahiko; Aono, Shinjiro; Tsubouchi, Akio; Ohashi, Tsuyoshi; Kato, Satoko; Doi, Masahiro; and Sakai, Makoto, to Toshiba Lighting & Technology Corporation Heater and image forming apparatus 12210304 Cl. G03G 15/2053.
Ueno, Masahiro: See--
Sakamoto, Takashi; Akage, Yuichi; Kawamura, Sohan; Ueno, Masahiro; and Oka, Soichi 12210264 Cl. G02F 1/29.
Ueno, Shohei: See--
Manami, Toshihiko; and Ueno, Shohei 12208545 Cl. B29B 9/12.
Ueno, Shuichi: See--
Takeshima, Kaito; Ueno, Shuichi; Shimauchi, Hideki; and Hosomi, Shinichi 12210074 Cl. G01R 33/093.
Ueno, Shunsuke: See--
Yodawara, Hideki; Aoki, Toshihisa; Hirata, Shozo; and Ueno, Shunsuke 12208996 Cl. B66C 13/40.
Ueno, Takahiro; Kiyohara, Toru; and Tashiro, Tomohiro, to Trivale Technologies Electro-optical apparatus 12210250 Cl. G02F 1/13452.
Uesugi, Tetsuo: See--
Ozaki, Goshi; Komatsu, Noriyuki; and Uesugi, Tetsuo 12210311 Cl. G03G 21/1647.
Ueta, Yoshihiro: See--
Handa, Shinichi; Ueta, Yoshihiro; and Iwata, Noboru 12209214 Cl. C09K 11/7701.
Ueyama, Daisuke: See--
Abe, Shinichi; Ueyama, Daisuke; and Shimizu, Etsuro 12209982 Cl. G01N 27/122.
Uezono, Tomoyuki: See--
Okubo, Sokichi; Uezono, Tomoyuki; Miyajima, Momoka; Shimasaki, Nagisa; and Matsuyama, Miyuki 12211988 Cl. H01M 4/0435.
Ugur, Kemal: See--
Hallapuro, Antti Olli; Ugur, Kemal; and Lainema, Jani 12212774 Cl. H04N 19/513.
Uhm, Yun: See--
Urbanski, John Paul; Dicicco, Matthew; Uhm, Yun; Godara, Neil; Rees, David; and Klein, James 12207836 Cl. A61B 17/3205.
Uhr, Joon Sun; Hong, Jay Wu; and Song, Joo Han, to CPLABS, INC. Tampering verification system and method for financial institution certificates, based on blockchain 12212692 Cl. H04L 9/3268.
Uhr, Oren Louis; to Laser Ammo Ltd. Dry fire training device RE050284 Cl. F41G 3/2655.
UiPath, Inc.: See--
Oancea, Radu; Tirca, Marius; and Oltean, Florin 12210889 Cl. G06F 9/452.
UISEE TECHNOLOGIES (ZHEJIANG) LTD.: See--
Yu, Lidong 12211162 Cl. G06T 19/20.
Ujhazy, Anthony John: See--
Celermajer, David Stephen; Ujhazy, Anthony John; Milijasevic, Zoran; and Carnegie, Mark 12208027 Cl. A61F 2/82.
Ulander, Maria: See--
Alriksson, Peter; and Ulander, Maria 12212956 Cl. H04W 36/0058.
ULMA Packaging, S. Coop: See--
Otxoa-Aizpurua Calvo, Alberto; and Izquierdo Ereño, Eneko 12208932 Cl. B65B 37/005.
Uln, Kiran: See--
Kolych, Igor; Kravets, Igor; and Uln, Kiran 12213044 Cl. H04W 4/80.
Ulrich, Drew: See--
Last, Matthew; Henrie, John; Kakani, Chandra; Shepard, Ralph; and Ulrich, Drew 12210207 Cl. G02B 7/026.
Ultima Genomics, Inc.: See--
Pratt, Mark; Almogy, Gilad; Brinza, Dumitru; Trepagnier, Eliane; Barad, Omer; Etzioni, Yoav; and Oberstrass, Florian 12209278 Cl. C12Q 1/6869.
ULTRA CLEAN HOLDINGS, INC.: See--
Hylbert, Jon; Keiser, Ross; and Milburn, Matthew 12209933 Cl. G01M 3/2853.
ULTRASONIUM INC: See--
Qiu, Jack Yanjie 12208450 Cl. B22F 10/50.
ULTROMICS LIMITED: See--
Beqiri, Arian; Parker, Andrew; Mumith, Jurriath Azmathi; Woodward, Gary; Markham, Deborah; and Upton, Ross 12207968 Cl. A61B 8/0883.
ULXIMA SOCIETÀ A RESPONSABILITÀ LIMITATA SEMPLIFICATA: See--
Tiso, Marco; and Gambato, Elisa 12211356 Cl. G08B 13/08.
Um, Gi Pyo; to SK hynix Inc. Memory system, memory controller and operating method of the memory system for controlling garbage collection 12210451 Cl. G06F 12/0253.
Um, In Sup: See--
Kim, Hyeok Soo; Lee, Se Ho; and Um, In Sup 12209003 Cl. B66F 9/0755.
Um, Ryan: See--
Edmiston, Daryl; Nordmann, Tyler; Garvin, Graham; Johnson, Dan; Bock-Aronson, Max; Freeman, Andy; Um, Ryan; Beyreis, Randall; and Hatcher, Brady 12208007 Cl. A61F 2/2457.
Umebayashi, Toyoshi; and Fujita, Hideki, to ZUIKO CORPORATION Method for producing cuffs for wearable article 12207993 Cl. A61F 13/15601.
Umeda, Hiromasa; and Henttonen, Tero, to NOKIA TECHNOLOGIES OY Reporting of achievable power per component carrier with multiple power sources 12213085 Cl. H04W 52/367.
Umemoto, Hideaki: See--
Chiba, Kazuhiro; Okada, Yohei; Umemoto, Hideaki; and Onaka, Takuya 12209106 Cl. C07H 21/04.
Umemoto, Hideki; and Gotou, Hirotsugu, to Yokogawa Electric Corporation Control support apparatus, control support method, computer readable medium with control support program recorded thereon and control system 12210328 Cl. G05B 17/02.
Umezaki, Atsushi; to Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device 12211569 Cl. G11C 19/184.
UMICORE: See--
Kumakura, Shinichi; Zhu, Liang; Paulsen, Jens Martin; and Kim, Gyeong-Ok 12211992 Cl. H01M 4/364.
UMICORE KOREA LTD.: See--
Kumakura, Shinichi; Zhu, Liang; Paulsen, Jens Martin; and Kim, Gyeong-Ok 12211992 Cl. H01M 4/364.
Umlauff, Alexander: See--
Ramb, Thomas; Dreher, Bernhard; Weber, Patrick; Umlauff, Alexander; and Coksen, Ahmet 12209511 Cl. F01D 9/041.
Ummethala, Upendra: See--
Zhang, Tao; and Ummethala, Upendra 12211670 Cl. H01J 37/32183.
UNBOXROBOTICS LABS PRIVATE LIMITED: See--
Memon, Mohammadshahid Abdulshakur; and Ghadge, Pramod Vasant 12208423 Cl. B07C 5/361.
Und, Peter Andrew; to Drägerwerk AG & Co, KGaA Cable manager 12212902 Cl. H04Q 1/062.
Under Armour, Inc.: See--
Santos, Craig 12207697 Cl. A43B 1/04.
Underhill, Derek Michael: See--
Nook, Jonathan Lewis; Nook, Sr., William Knight; Stanfield, James Richard; and Underhill, Derek Michael 12212170 Cl. H02J 7/0042.
Nook, Jonathan Lewis; Nook, William Knight; Stanfield, James Richard; and Underhill, Derek Michael 12208696 Cl. B60L 53/14.
Underwood, Thomas Charles: See--
Falk, Steven Mitchell; Pirtini Cetingul, Muge; Becker, Karen Popp; Cipriano, James Patrick; and Underwood, Thomas Charles 12207937 Cl. A61B 5/4836.
Unger, John; Oto, Christopher K.; Lee, Danny Shu-Huan; Wales, Ryan; Burnham, Alexander Joseph; and Andreotti, Tracy, to BOSTON SCIENTIFIC SCIMED, INC. Tissue retraction device and delivery system 12208219 Cl. A61M 25/0082.
UNICOM SYSTEMS, INC.: See--
Savage, Bret; Marshall, Casey; Stutchman, Geoffrey; Eltherington, Ross; Owens, Steve; and Northup, George 12210488 Cl. G06F 16/178.
Savage, Bret; Marshall, Casey; Stutchman, Geoffrey; Eltherington, Ross; Owens, Steve; and Northup, George 12210489 Cl. G06F 16/182.
Unicorn Biotechnologies Ltd.: See--
Freeman, George Leonard; Houghton, Albert; Heimann, Carl; Jasik, Jakub; Mitchell, Adam; Culshaw, Poppy; and Glen, Adam 12208229 Cl. A61M 39/18.
UNICYTE EV AG: See--
Brizzi, Maria Felice; Camussi, Giovanni; and Ranghino, Andrea 12208120 Cl. A61K 35/14.
Unirac, Inc.: See--
Ganshaw, Todd; Gallegos, Ernest; and Uppu, Sai D1059261 Cl. D13‑102.
UNIST (ULSAN National Institute of Science and Technology): See--
Seol, Minsu; Shin, Hyeonsuk; Shin, Hyeonjin; Hwang, Hyuntae; Lee, Changseok; and Yoon, Seongin 12211904 Cl. H01L 29/267.
UNITED ARAB EMIRATES UNIVERSITY: See--
Aslam, Zulfiqar 12208217 Cl. A61M 21/02.
UNITED MICROELECTRONICS CORP.: See--
Chiu, Hou-Jen; Chao, Mei-Ling; Tang, Tien-Hao; and Su, Kuan-Cheng 12211833 Cl. H01L 27/0259.
Hsu, Chih-Kai; Fu, Ssu-I; Chiu, Chun-Ya; Wu, Chi-Ting; Chen, Chin-Hung; and Lin, Yu-Hsiang 12211751 Cl. H01L 21/823481.
Kuo, Chih-Wei; and Chiu, Chung-Yi 12213389 Cl. H10N 70/826.
Lai, Kuo-Chih; Hsu, Chi-Mao; Chou, Shih-Min; Ho, Nien-Ting; Hsiao, Wei-Ming; Chen, Li-Han; Yu, Szu-Yao; and Huang, Hsin-Fu 12211888 Cl. H01L 28/24.
Lin, Yeh-Sheng; Wang, Chang-Mao; Yu, Chun-Chi; and Chiu, Chung-Yi 12211699 Cl. H01L 21/31111.
Tsai, Ming-Hua; Han, Jung; Li, Ming-Chi; Lin, Chih-Mou; Hung, Yu-Hsiang; Lin, Yu-Hsiang; and Shih, Tzu-Lang 12211915 Cl. H01L 29/42368.
United Parcel Service of America, Inc.: See--
Staples, Jay Christian 12210996 Cl. G06Q 10/083.
United Semiconductor (Xiamen) Co., Ltd.: See--
Kong, Dejin; Ouyang, Jinjian; Kong, Xiang Bo; and Tan, Wen Yi 12213391 Cl. H10N 70/841.
United Services Automobile Association (USAA): See--
Bueche, Jr., Michael Patrick; Prasad, Bharat; Liang, Minya; Medina, Reynaldo; and Oakes, III, Charles Lee 12211095 Cl. G06Q 40/02.
Durairaj, Ravi; Farmer, William Daniel; Hartshorn, Joel S.; Kou, Qunying; and Yarbrough, Gregory 12210915 Cl. G06F 9/5094.
Nash, Justin Royell; Luck, Gideon Bowie; Wu, Huihui; Kennedy, Julia Yilan; Khmelev, Yevgeniy Viatcheslavovich; Selvam, Subhalakshmi; and Billman, Bradly Jay 12209381 Cl. E02D 33/00.
Prasad, Bharat; Burks, Rickey Dale; and Liang, Minya 12211015 Cl. G06Q 20/042.
United States Endoscopy Group, Inc.: See--
Haack, Scott; Ranallo, Cynthia; Moore, Craig; Uspenski, Alex; Torer, Steven; and Still, Rapheal 12207837 Cl. A61B 17/32056.
United States Government as represented by the Department of Veterans Affairs: See--
Cooper, Rory A.; and Gebrosky, Benjamin 12208857 Cl. B62M 3/14.
United States of America as represented by the Administrator of NASA: See--
McBryan, Emily R.; Rogers, Jonathan M.; Peters, Benjamin J.; and Laske, Evan 12208597 Cl. B32B 27/36.
United States of America, as represented by the Secretary, Department of Health and Human Services, The: See--
Khurana, Surender 12210017 Cl. G01N 33/56983.
United States of America as represented by the Secretary of the Air Force: See--
Bishop, Morgan A.; Nagy, James M.; Pottenger, William M.; Hoogs, Anthony; and Tong, Tuanjie 12211278 Cl. G06V 20/46.
Rogers, Travis 12208924 Cl. B64F 5/10.
United States of America as Represented by The Secretary of the Army, The: See--
Fish, Michael C. 12213379 Cl. H10N 10/13.
Heath, James R.; Idso, Matthew; Winton, Alexander J.; Coppock, Matthew B.; and Liu, Sanchao 12209142 Cl. C07K 7/08.
Terrell, Jessica L.; and Jahnke, Justin P. 12209265 Cl. C12P 19/04.
United States of America, as Represented by the Secretary of the Navy, The: See--
Burkart, Joseph Thomas; Cafasso, Danielle E.; Hayford, Robert Henry; Finne, Huckelberry; Vargas, Jose Ramirez; and Abbott, Michael P 12207824 Cl. A61B 17/1325.
Ferrara, Peter J.; Kephart, Jacob T.; and Friedman, Avi 12209785 Cl. F25B 9/14.
Miesner, John E. 12211646 Cl. H01F 7/1615.
Ruffa, Anthony A; and Amaral, Brian K 12209960 Cl. G01N 21/474.
UnitedHealth Group Incorporated: See--
Catani, Steven; Guo, Yinglong; Ehlert, Benjamin W.; Lensing, Cody James; and Garth, Stephen Rushton 12207950 Cl. A61B 5/7275.
Unity Technologies SF: See--
Singh, Karan 12211165 Cl. G06T 19/20.
Universal City Studios LLC: See--
Polk, Jeff; Derda, Dave; Geraghty, Thomas Martin; Schwartz, Justin Michael; and Traynor, Mark James 12210983 Cl. G06Q 10/02.
Swim, Jr., Richard Joseph; Gakoumis, Jr., George Peter; Usi, Matthew Tangan; Hawk, Jason William; Mandile, Anthony Louis; Stuckey, Brian Matthew; Luedtke, Vanessa Rachael; and Goodner, Douglas Evan 12212054 Cl. H01Q 1/44.
Universal Display Corporation: See--
Hack, Michael; and Weaver, Michael Stuart 12211414 Cl. G09G 3/2003.
Universal Electronics Inc.: See--
Hascher, Thomas; and Koopmans, Menno 12212802 Cl. H04N 21/42227.
Mui, Daniel Saufu 12211374 Cl. G08C 19/00.
UNIVERSIDAD AUTONOMA DE MADRID: See--
Puigmarti-Luis, Josep; Zamora Abanades, Felix Juan; Franco Pujante, Carlos; Rodriguez San Miguel, David; and Sorrenti, Alessandro 12209103 Cl. C07F 1/08.
Universidad Mayor: See--
Velozo, Juan; Huth, Steffany; and Polanco, Victor 12209264 Cl. C12P 17/06.
Universidade de Sao Paulo: See--
Bagnato, Vanderlei Salvador; Cypel, Marcelo; Keshavjee, Shafique; Waddell, Thomas Kenneth; and Galasso, Marcos Theophilo 12207651 Cl. A01N 1/0294.
Università Degli Studi Di Genova: See--
De Angelis, Francesco; Barbaglia, Andrea; Dipalo, Michele; and Tantussi, Francesco 12208388 Cl. B01L 3/502715.
UNIVERSITAET BAYREUTH: See--
Herink, Georg 12209860 Cl. G01B 9/02014.
Universität Basel: See--
Müller, Cristina; Schibli, Roger; Van Der Meulen, Nicholas Philip; Borgna, Francesca; Wild, Damian; and Fani, Melpomeni 12208145 Cl. A61K 51/083.
UNIVERSITE CLAUDE BERNARD LYON 1: See--
Dupoy, Mathieu; Fournier, Maryse; Benyattou, Taha; Jamois, Cécile; Berguiga, Lotfi; Gaignebet, Nicolas; and Gehin, Thomas 12209956 Cl. G01N 21/35.
UNIVERSITE D'AIX-MARSEILLE (AMU): See--
Redha, Abdeddaim; Adenot-Engelvin, Anne-Lise; Dubois, Marc; Enoch, Stefan; Mallejac, Nicolas; Raolison, Zo; Sabouroux, Pierre; and Vignaud, Alexandre 12210076 Cl. G01R 33/288.
UNIVERSITÉ DE LILLE: See--
Giacobini, Paolo; and Prevot, Vincent 12208130 Cl. A61K 38/09.
UNIVERSITÉ DE STRASBOURG: See--
Baati, Rachid; Brown, Richard; Dias, José; Maryan-Instone, Alex; and Yerri, Jagadeesh 12209090 Cl. C07D 473/34.
Université Laval: See--
Siccardi, Pierre; Jolin, Marc; Jacob-Vaillancourt, Thomas; and Gagnon, Antoine 12208538 Cl. B28C 5/026.
UNIVERSITE PARIS-EST CRETEIL VAL DE MARNE: See--
Carteaux, Guillaume; and Mekontso Dessap, Armand 12208059 Cl. A61H 31/02.
UNIVERSITEIT GENT: See--
Verhulst, Sarah; Drakopoulos, Fotios; Van Den Broucke, Arthur; and Keshishzadeh, Sarineh 12212929 Cl. H04R 25/507.
UNIVERSITEIT LEIDEN: See--
Van Deursen, Pauline Marthe Gerardina; Schneider, Gregory Fabrice; Kros, Alexander; and Tudor, Viorica 12209979 Cl. G01N 23/2202.
UNIVERSITY COLLEGE CARDIFF CONSULTANTS LTD: See--
Wu, Jianzhong; and Aithal, Avinash 12210071 Cl. G01R 31/42.
University Health Network: See--
Bagnato, Vanderlei Salvador; Cypel, Marcelo; Keshavjee, Shafique; Waddell, Thomas Kenneth; and Galasso, Marcos Theophilo 12207651 Cl. A01N 1/0294.
University-Industry Cooperation Group of Kyung Hee University: See--
Kim, Hui Yong; Park, Gwang Hoon; Kim, Kyung Yong; Kim, Sang Min; Lim, Sung Chang; Lee, Jin Ho; Choi, Jin Soo; and Kim, Jin Woong 12212740 Cl. H04N 19/105.
Kim, Hui Yong; Park, Gwang Hoon; Kim, Kyung Yong; Kim, Sang Min; Lim, Sung Chang; Lee, Jin Ho; Choi, Jin Soo; and Kim, Jin Woong 12212741 Cl. H04N 19/105.
University of Central Florida Research Foundation, Inc.: See--
Akula, Ramya; and Garibay, Ivan 12210833 Cl. G06F 40/30.
Dogariu, Aristide; and Eshaghi, Mahdi 12209911 Cl. G01J 4/04.
Mach, Lam; Divliansky, Ivan; and Glebov, Leonid 12210175 Cl. G02B 5/1857.
University of Cincinnati: See--
Wang, Jinghua; and He, Lili 12207939 Cl. A61B 5/4848.
UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA: See--
Zhang, Bo; Niu, Zhongqian; Yang, Xiaobo; Dai, Bingli; Hu, Yi; Zhang, Jicong; Fan, Yong; Liu, Ke; and Chen, Zhi 12212357 Cl. H04B 1/40.
University of Florida Research Foundation, Inc.: See--
Bhunia, Swarup; Rahman, Md Moshiur; Dasgupta, Aritra; and Alaql, Abdulrahman 12210663 Cl. G06F 21/85.
Veige, Adam S.; and Jakhar, Vineet K. 12209162 Cl. C08G 61/08.
UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INCORPORATED: See--
Gardner, Matthew; and Farzan, Michael 12209113 Cl. C07K 14/70514.
University of Galway: See--
Cummins, Sean; Phelan, Nigel; Cox, Stephen; and O'Halloran, Martin 12207807 Cl. A61B 17/00008.
University of Houston System: See--
Mckeon, Frank; and Vincent, Matthew 12208287 Cl. C12N 5/068.
Qin, Guoting; and Cai, Chengzhi 12208159 Cl. A61K 9/0051.
University of Kansas: See--
Rosa-Molinar, Eduardo 12211664 Cl. G01N 1/06.
University of Kentucky Research Foundation: See--
Rush, Craig R. 12208083 Cl. A61K 31/357.
University of Leeds, The: See--
Leonov, German; White, Simon; Stockley, Peter; Patel, Nikesh; Wroblewski, Emma; Maskell, Dan; Twarock, Reidun; Bingham, Richard; Weiss, Eva; and Dykeman, Eric 12209241 Cl. C12N 15/1131.
UNIVERSITY OF LIMERICK: See--
Collins, Maurice N.; Rubio, Mario Culebras; and McGrail, Patrick Terence 12209332 Cl. D01F 9/17.
University of Massachusetts: See--
Donahue, John Kevin 12207932 Cl. A61B 5/363.
Hardy, Jeanne A.; and Meka, Penchala Narasimharao 12209097 Cl. C07D 498/04.
University of North Carolina at Chapel Hill, The: See--
Coghill, James M.; and Fowler, Kenneth A. 12208105 Cl. A61K 31/575.
Xiao, Xiao; and Li, Juan 12209263 Cl. C12N 9/644.
Xiao, Xiao; Qian, Randolph; and Li, Juan 12209251 Cl. C12N 15/86.
UNIVERSITY OF NORTH TEXAS HEALTH SCIENCE CENTER: See--
Lacko, Andras G.; Prokai, Laszlo; and Isaac-Olivé, Keila 12208146 Cl. A61K 51/1224.
University of Pittsburgh—Of the Commonwealth System of Higher Education: See--
Cooper, Rory A.; and Gebrosky, Benjamin 12208857 Cl. B62M 3/14.
University of Pittsburgh—Of the Commonwealth System or Higher Education: See--
Adedipe, Adeyinka; Nichol, Graham; Mourad, Pierre D.; Salcido, David; Kucewicz, John; and Sundermann, Matthew 12208057 Cl. A61H 31/006.
UNIVERSITY OF PORTSMOUTH HIGHER EDUCATION CORPORATION: See--
Young, John S.; and Firouzmand, Sepinoud 12210022 Cl. G01N 33/6893.
UNIVERSITY OF SEOUL INDUSTRY COOPERATION FOUNDATION: See--
Lee, Ho Taek; Kim, Yong Min; and Moon, Hong Chul 12211972 Cl. H01M 10/0565.
UNIVERSITY OF SOUTH AUSTRALIA: See--
Brooks, Doug; Parkinson-Lawrence, Emma; Johnson, Ian R. D.; and Butler, Lisa 12209286 Cl. C12Q 1/6886.
UNIVERSITY OF SOUTH CAROLINA: See--
Jabbari, Esmaiel 12208168 Cl. A61K 9/5153.
University of Southampton: See--
Zheludev, Nikolay Ivanovich; Yuan, Guanghui; Papasimakis, Nikitas; and Savinov, Vassily 12211241 Cl. G06V 10/145.
University of Southern California: See--
Chen, Thomas 12208066 Cl. A61K 31/045.
Prager, Samuel; Moghaddam, Mahta; and Stang, John 12210117 Cl. G01S 7/2886.
Puranic, Aniruddh Gopinath; Deshmukh, Jyotirmoy; and Nikolaidis, Stefanos 12208521 Cl. B25J 9/163.
University of Sussex, The: See--
Memoli, Gianluca; Caleap, Mihai; Drinkwater, Bruce; and Subramanian, Sriram 12211481 Cl. G10K 11/30.
University of Tokyo, The: See--
Fukuzaki, Eiji; Watanabe, Tetsuya; Usami, Yoshihisa; Tani, Yukio; Okamoto, Toshihiro; and Takeya, Junichi 12213377 Cl. H10K 85/6572.
UNIVERSITY OF ULSAN FOUNDATION FOR INDUSTRY COOPERATION: See--
Kang, Soo Jin; and Min, Hyun Seok 12211203 Cl. G06T 7/0012.
UNIVERSITY OF UTAH RESEARCH FOUNDATION: See--
Hayes, Mark; Skliar, Mikhail; Porter, Marc; Copp, Brennan; Hayes, Samuel; and Ramirez, Alexis 12208400 Cl. B03C 5/005.
Lenzi, Tommaso; Gabert, Lukas R.; and Tran, Minh 12208026 Cl. A61F 2/6607.
University of Vermont and State Agricultural College: See--
Hunt-Schroeder, Eric; and Xia, Tian 12210631 Cl. G06F 21/60.
University of Virginia Patent Foundation: See--
Clarens, Andres F.; and Plattenberger, Dan A. 12209053 Cl. C04B 28/188.
Foley, Brian M.; Gaskins, John T.; and Hopkins, Patrick E. 12209961 Cl. G01N 21/55.
University of Washington: See--
Adedipe, Adeyinka; Nichol, Graham; Mourad, Pierre D.; Salcido, David; Kucewicz, John; and Sundermann, Matthew 12208057 Cl. A61H 31/006.
Newbloom, Gregory M.; West, Aaron F.; Kastilani, Ryan; Wei, Canfeng; Rodriguez, Jaime; Pozzo, Lilo D.; and Martin, Lauren 12208362 Cl. B01D 67/0048.
Regnier, Michael; Murry, Charles E.; and Guan, Xuan 12208133 Cl. A61K 38/44.
University of York, The: See--
Leonov, German; White, Simon; Stockley, Peter; Patel, Nikesh; Wroblewski, Emma; Maskell, Dan; Twarock, Reidun; Bingham, Richard; Weiss, Eva; and Dykeman, Eric 12209241 Cl. C12N 15/1131.
UNLIKELY ARTIFICIAL INTELLIGENCE LIMITED: See--
Tunstall-Pedoe, William; Curran, Finlay; Roscoe, Harry; and Heywood, Robert 12210843 Cl. G06F 40/35.
UNLIKELY ARTIFICIAL INTELLIGENCE LIMTED: See--
Tunstall-Pedoe, William; Curran, Finlay; Roscoe, Harry; and Heywood, Robert 12210841 Cl. G06F 40/35.
UNM Rainforest Innovations: See--
Brinker, C. Jeffrey; Guo, Jimin; and Zhu, Wei 12208164 Cl. A61K 9/1075.
Plusquellic, James; and Heeger, Derek 12212551 Cl. H04L 63/08.
Uno, Taketoshi: See--
Imoto, Tsuyoshi; Kawahara, Naoki; Yagihara, Daiki; and Uno, Taketoshi 12211327 Cl. G07C 5/0808.
Uno, Yudai: See--
Yamamoto, Takeshi; Uno, Yudai; Ina, Hiroyoshi; Asai, Keiichiro; and Tai, Tomoyoshi 12212301 Cl. H03H 9/02574.
Unrath, Russell: See--
Quarles, John; King, Kevin; Richmond, Sarah; and Unrath, Russell 12210668 Cl. G06F 3/011.
Unrau, Jackson Andrew; to Worldpay, LLC Systems and methods for prepaid card funding for sponsored purchases 12211029 Cl. G06Q 20/3433.
Unser, Kelsey A.: See--
Kumar, Samuel S.; Rodman, Anthony C.; Unser, Kelsey A.; Manda, Ramakrishna; and Martin, Glen C. 12209524 Cl. F01N 3/208.
Unverdorben, Felix: See--
Yousef, Sara; Brunk, Fabian; Moritz, Andreas; Bunk, Sebastian; Wagner, Claudia; Maurer, Dominik; and Unverdorben, Felix 12209137 Cl. C07K 16/3069.
Upadhyay, Sagar; Tankasala, Archana; Madraswala, Aliasgar S.; and Rajwade, Shantanu, to Intel Corportaion Dynamic gate steps for last-level programming to improve write performance 12211563 Cl. G11C 16/3459.
Upadhyay, Swami: See--
Purohit, Hitendra; Mishra, Agrim; Baviskar, Nitesh G.; Bhardwaj, Rohit; Kshirsagar, Saniya; Kumar G., Sharath; and Upadhyay, Swami 12207795 Cl. A61B 1/0052.
Upendra, Balehithlu Manjappaiah; and Koo, Kok Kiat, to Infineon Technologies Austria AG Semiconductor package and lead frame with enhanced device isolation 12211770 Cl. H01L 23/4951.
Uppaluri, Padmaja: See--
Marzinzik, Duane Lee; Moore, Eric R.; Carter, Gregory D.; Lalwani, Harsh; Mifflin, Matthew; Uppaluri, Padmaja; Jewell, Ryan; and Lovings, Richard J. 12212712 Cl. H04M 3/4936.
Uppu, Sai: See--
Ganshaw, Todd; Gallegos, Ernest; and Uppu, Sai D1059261 Cl. D13‑102.
Uprit, Saurabh; and Tayade, Amar Rajendra, to Bank of America Corporation Blockchain-based digital exchange platform with reduced latency and increased security and efficiency 12211098 Cl. G06Q 40/04.
Upton, Ross: See--
Beqiri, Arian; Parker, Andrew; Mumith, Jurriath Azmathi; Woodward, Gary; Markham, Deborah; and Upton, Ross 12207968 Cl. A61B 8/0883.
Urakawa, Masafumi; to TOKYO ELECTRON LIMITED Recipe updating method 12211678 Cl. H01J 37/3299.
Urban Accessories, Inc.: See--
Rustad, Nikolas D1059224 Cl. D12‑115.
Urban, Bruce: See--
Coppola, Roberto; Jadeja, Rajendrasinh; Rodriguez, Frank; Purohit, Nimish; Apple, Sandra; Urban, Bruce; Thomas, Alfred; Hendrickson, Scott; Shaffer, Jr., Stephen; Gong, Xiaoqiang; Kaminkow, Joseph; Cleveland, Christopher; Turgel, Ariel; Harden, Daniel; Nakazawa, Akifusa; and Martin, Benjamin 12208171 Cl. A61L 2/10.
Urban, Fabrice: See--
De Lagrange, Philippe; Leleannec, Fabrice; Urban, Fabrice; and Naser, Karam 12212757 Cl. H04N 19/136.
Urbanski, John Paul; Dicicco, Matthew; Uhm, Yun; Godara, Neil; Rees, David; and Klein, James, to Boston Scientific Medical Device Limited Methods and devices for puncturing tissue 12207836 Cl. A61B 17/3205.
Uribe, Danny: See--
Pulkrabek, Larry; Warner, Ty; Uribe, Danny; and Hedberg, Ron 12207633 Cl. A01K 89/01902.
Uridil, Morgan: See--
Kurt, Alyssa; Uridil, Morgan; Kaidantsis, Stephen; Hahn, Vincent; and Phalen, Drew 12208044 Cl. A61G 7/1028.
Urilift Beheer B.V.: See--
Schimmel, Marten Alberto 12207773 Cl. A47L 11/125.
Uriu, Eiichi: See--
Hasegawa, Kenji; Uriu, Eiichi; Hasegawa, Kazuya; Ishibashi, Tasuku; Abe, Hiroyuki; Nonaka, Masataka; Shimizu, Takeshi; and Ishikawa, Haruhiko 12209454 Cl. E06B 3/6775.
Urkalan, Kaveri Balan: See--
Abraham, Adedoyin David; Bume, Desta Doro; Condroski, Kevin Ronald; Hazlitt, Robert Alan; Kercher, Timothy Scott; Metcalf, Andrew Terrance; Urkalan, Kaveri Balan; Walls, Shane Michael; and Dilger, Andrew Karl 12209086 Cl. C07D 471/04.
Urnov, Fyodor: See--
Stamatoyannopoulos, John A.; Urnov, Fyodor; Pearl, Jocelynn; and Thomas, Sean 12209259 Cl. C12N 9/22.
Ursu, Peter; Zhou, Jiachun; Soh, Siang; and Bahaj, Justin, to Smiths Interconnect Americas, Inc. Test socket for semiconductor integrated circuits 12210036 Cl. G01R 1/0466.
Urtasun, Raquel; Ren, Mengye; Pokrovsky, Andrei; and Yang, Bin, to AURORA OPERATIONS, INC. Sparse convolutional neural networks 12210344 Cl. G05D 1/0088.
Urushibata, Yuji: See--
Ashida, Masami; Urushibata, Yuji; and Takayama, Kiyoshi 12208113 Cl. A61K 31/7088.
US Conec Ltd.: See--
Cloud, Mitchell; Higley, Jason; and Childers, Darrell R. 12210196 Cl. G02B 6/3851.
Higley, Jason D1059304 Cl. D13‑156.
Usami, Taro: See--
Hirata, Natsuki; Yoshida, Shinya; Kuno, Tatsuya; Inoue, Seiya; Usami, Taro; Yonemoto, Kenji; and Saito, Aoi 12211729 Cl. H01L 21/6833.
Usami, Tetsuro; to YOSHINO KOGYOSHO CO., LTD. Bottle 12208937 Cl. B65D 1/0207.
Usami, Yoshihisa: See--
Fukuzaki, Eiji; Watanabe, Tetsuya; Usami, Yoshihisa; Tani, Yukio; Okamoto, Toshihiro; and Takeya, Junichi 12213377 Cl. H10K 85/6572.
Used-Car-Parts.com, Inc.: See--
Schroder, Jeffrey L.; Schroder, Jeffrey Joseph; Mueller, Jeffrey W.; Chastain, Jeffrey Dalton; Canisalez, Luis Daniel; Mount, Jeremy M.; Daniel, Aaron Edward; Cohen, Robert S.; and Donica, Laura Beth 12211079 Cl. G06Q 30/0623.
Usenko, Alex; to Taiwan Semiconductor Manufacturing Company, Ltd. Methods of forming SOI substrates 12211686 Cl. H01L 21/02019.
Ushijima, Satoru; Ishida, Ryo; and Aoki, Yasuhiro, to FUJITSU LIMITED Non-transitory computer-readable recording medium, notification method, and information processing device 12211281 Cl. G06V 20/52.
Usi, Matthew Tangan: See--
Swim, Jr., Richard Joseph; Gakoumis, Jr., George Peter; Usi, Matthew Tangan; Hawk, Jason William; Mandile, Anthony Louis; Stuckey, Brian Matthew; Luedtke, Vanessa Rachael; and Goodner, Douglas Evan 12212054 Cl. H01Q 1/44.
Uspenski, Alex: See--
Haack, Scott; Ranallo, Cynthia; Moore, Craig; Uspenski, Alex; Torer, Steven; and Still, Rapheal 12207837 Cl. A61B 17/32056.
Usui, Kunihiko: See--
Akiyama, Yosuke; Ijichi, Akira; Kobayashi, Taichi; Takaira, Koji; Homan, Akinori; Itou, Yoshio; and Usui, Kunihiko 12208679 Cl. B60K 23/0808.
UTAC Headquarters Pte Ltd.: See--
Shim, Il Kwon; Punzalan, Jeffrey; Espiritu, Emmanuel; Ilagan, Allan; and Carreon, Teddy Joaquin 12211863 Cl. H01L 27/14618.
Utherverse Gaming LLC: See--
Shuster, Brian Mark; and Shuster, Gary Stephen 12208324 Cl. A63F 13/30.
Utopus Insights, Inc.: See--
Aggarwal, Aanchal; Kim, Younghun; Kumar, Tarun; and Raman, Abhishek 12211008 Cl. G06Q 10/20.
Utsunomiya, Yoshinori; to Tokyo Electron Limited Treatment solution supply apparatus, reporting method, and storage medium 12210292 Cl. G03F 7/70525.
Uyama, Keisuke: See--
Kobayashi, Yohei; Soma, Yoshio; and Uyama, Keisuke 12207794 Cl. A61B 1/00188.
Uyeda, Mark T.: See--
Cernokus, Evan; and Uyeda, Mark T. D1059200 Cl. D9‑456.
Uzan, Steven: See--
Baylin, Benoit; Dancie, Nicolas; Martin, Antoine; Martin, Julien; Sinton, Antoine; and Uzan, Steven 12213028 Cl. H04W 4/029.
Uzoh, Cyprian Emeka; to ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC. Structure with conductive feature and method of forming same 12211809 Cl. H01L 24/05.
Uzunovic, Nenad: See--
Enke, Joseph A.; Moskovchenko, Stepan; Tankersley, Benjamin P.; Fenn, Adam; and Uzunovic, Nenad 12212847 Cl. H04N 23/685.