CPC H01L 23/49838 (2013.01) [H01L 21/486 (2013.01); H01L 23/147 (2013.01); H01L 23/49827 (2013.01); H01L 23/49866 (2013.01)] | 18 Claims |
1. A semiconductor device assembly, comprising:
a silicon core structure comprising:
a first side opposing a second side; and
a conductive interconnection formed through the silicon core structure, wherein the conductive interconnection has a first surface exposed at the first side, a second surface exposed at the second side, and a third surface disposed between the first surface and the second surface;
an insulating layer disposed over the first side, the second side, and between the third surface of the conductive interconnection and the silicon core structure; and
a heat exchanger coupled to the silicon core structure, wherein the heat exchanger is disposed within a pocket formed in the insulating layer and coupled to the silicon core structure via an interfacial layer.
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