CPC G11C 7/04 (2013.01) [G11C 7/109 (2013.01); G11C 7/1063 (2013.01)] | 18 Claims |
1. A memory device comprising:
a memory die comprising:
an internally-powered thermometer comprising a first temperature measurement circuit to perform first operations comprising:
measuring a first measured operating temperature value of the memory die;
detecting the first measured operating temperature value satisfies one of a first condition or a second condition; and
generating a first signal indicating an out-of-range operating temperature of the memory die in response to one of the first condition or the second condition being satisfied by the first measured operating temperature value; and
an externally-powered thermometer comprising a second temperature measurement circuit to perform second operations comprising:
measuring a second measured operating temperature value of the memory die;
detecting the second measured operating temperature value satisfies one of the first condition or the second condition; and
generating a second signal indicating the out-of-range operating temperature of the memory die in response to one of the first condition or the second condition being satisfied by the second measured operating temperature value.
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