US 11,879,935 B2
Testing of microelectronics device and method
Todd Eric Chornenky, Carmichaels, PA (US); James Robert Uplinger, II, Cranberry Township, PA (US); Andrew Richard Portune, Oakdale, PA (US); and Walter J Keller, III, Bridgeville, PA (US)
Assigned to NOKOMIS, INC., Canonsburg, PA (US)
Filed by Nokomis, Inc., Canonsburg, PA (US)
Filed on Sep. 25, 2020, as Appl. No. 17/032,719.
Prior Publication US 2022/0099734 A1, Mar. 31, 2022
Int. Cl. G01R 31/312 (2006.01)
CPC G01R 31/312 (2013.01) 17 Claims
OG exemplary drawing
1. An apparatus, comprising:
a testing fixture configured to receive an electronic part specimen under test (PSUT) and energize the PSUT without a direct pin-to-metal electrical contact with the PSUT;
a shielded enclosure having an interior and exterior, the testing fixture positioned within the interior; a receiving antenna positioned within the interior;
a transmission chain connected to the testing fixture, the transmission chain at least including a filter to pass a high power signal to the testing fixture;
a receiving chain connected to the receiving antenna, the receiving chain at least including a filter to pass a low power signal;
and an analysis unit connected to the receiving chain to analyze the low power signal,
wherein the testing fixture comprises a capacitive member to capacitively energize the PSUT.