	US 11,879,330 B2
	System and methods for downhole property measurement
Michel Joseph LeBlanc, Houston, TX (US); Bin Dai, Spring, TX (US); and James M. Price, Cypress, TX (US)
Assigned to Halliburton Energy Services, Inc., Houston, TX (US)
Filed by Halliburton Energy Services, Inc., Houston, TX (US)
Filed on Jun. 28, 2022, as Appl. No. 17/852,137.
Application 17/852,137 is a continuation of application No. 16/469,556, granted, now 11,401,807, previously published as PCT/US2018/048099, filed on Aug. 27, 2018.
Prior Publication US 2022/0341320 A1, Oct. 27, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. E21B 49/08 (2006.01); G01N 21/21 (2006.01); G01N 21/31 (2006.01); G01N 21/80 (2006.01)

CPC E21B 49/0875 (2020.05) [E21B 49/088 (2013.01); G01N 21/21 (2013.01); G01N 21/31 (2013.01); G01N 21/80 (2013.01)]

20 Claims

1. A device, comprising:

a sample cell configured to interact a fluid sample with an ion selective substrate to modify an optical characteristic of the ion selective substrate according to an ion concentration of the fluid sample, wherein the sample cell is also configured to optically interact an illumination light with the ion selective substrate to generate a sample light;

an optical element configured to interact with the sample light to provide a modified light that has a property of the fluid sample; and

a detector that receives the modified light and provides an electrical signal proportional to the property of the fluid sample indicated by the modified light; and

wherein the ion selective substrate comprises a membrane, the membrane configured to change an optical property in a selected wavelength range, according to the property of the fluid sample, wherein the membrane comprises multiple materials each having different cutoff concentrations.

15. A method, comprising:

allowing an ion exchange between an ion selective substrate and a sample;

optically interacting the ion selective substrate with a source light provided by an optical source, to generate a modified light, wherein optically interacting the ion selective substrate with the source light comprises optically interacting the ion selective substrate with an optical element to generate the modified light;

detecting a change in an optical response of the ion selective substrate based on the modified light;

determining a property of the sample from the change in the optical response of the ion selective substrate;

determining a fluid property of the sample from the determined property of the sample and a fluid model; and

modifying an operational parameter in a wellbore for oil and gas exploration or extraction according to an ion concentration of the sample; and

wherein the ion selective substrate comprises a membrane, the membrane configured to change an optical property in a selected wavelength range, according to the property of the sample, wherein the membrane comprises multiple materials each having different cutoff concentrations.