US 12,207,007 B2
Image sensor, processor of image sensor, and image processing method
Eunseung Yun, Suwon-si (KR); Gyeonghan Cha, Suwon-si (KR); Jaehyuck Kang, Suwon-si (KR); and Daechul Kwon, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Feb. 1, 2023, as Appl. No. 18/162,943.
Claims priority of application No. 10-2022-0016429 (KR), filed on Feb. 8, 2022; and application No. 10-2022-0082761 (KR), filed on Jul. 5, 2022.
Prior Publication US 2023/0254474 A1, Aug. 10, 2023
Int. Cl. H04N 25/69 (2023.01); H04N 17/00 (2006.01); H04N 25/78 (2023.01)
CPC H04N 25/69 (2023.01) [H04N 17/002 (2013.01); H04N 25/78 (2023.01)] 19 Claims
OG exemplary drawing
 
1. An image sensor comprising:
a test image generator configured to receive pixel data of a group of pixels comprising a channel that corresponds to a size of a plurality of row regions of a pixel array, wherein the pixel array comprises the plurality of row regions and a plurality of column regions, wherein the test image generator is configured to generate test image data based on the pixel data; and
an interface configured to transmit the test image data from the test image generator to a test device,
wherein the test image generator is configured to divide the pixel data into a first column region corresponding to a 2n-th column region of the column regions of the pixel data and a second column region corresponding to a 2n−1-th column region of the column regions of the pixel data and is further configured to generate a test image based on the first column region.