US 12,205,657 B2
Hybrid smart verify for QLC/TLC die
Xiang Yang, Santa Clara, CA (US); Henry Chin, Fremont, CA (US); Erika Penzo, San Jose, CA (US); and Muhammad Masuduzzaman, Milpitas, CA (US)
Assigned to SanDisk Technologies LLC, Austin, TX (US)
Filed by SanDisk Technologies LLC, Addison, TX (US)
Filed on Aug. 25, 2022, as Appl. No. 17/895,412.
Prior Publication US 2024/0071524 A1, Feb. 29, 2024
Int. Cl. G11C 16/34 (2006.01); G11C 16/10 (2006.01); G11C 16/14 (2006.01)
CPC G11C 16/3459 (2013.01) [G11C 16/102 (2013.01); G11C 16/14 (2013.01); G11C 16/3404 (2013.01)] 9 Claims
OG exemplary drawing
 
1. An apparatus comprising:
one or more control circuits configured to connect to a memory structure comprising non-volatile memory cells, wherein the one or more control circuits are configured to:
program a first group of the memory cells in the memory structure using a four-bit code having sixteen states and four pages;
program a second group of the memory cells in the memory structure using a three-bit code based on three pages of the four pages, wherein the three-bit code includes eight states of the sixteen states of the four-bit code for which an unused page of the four-bit code comprises a default value; and
begin to verify during programming using the three-bit code, for each particular state of a first set of one or more states of the eight states, during a program-verify loop determined based on whether a number of memory cells having a threshold voltage above a verify voltage for a state that immediately precedes the particular state in threshold voltage is greater than a pre-determined number.