US 12,204,773 B2
Semiconductor device for performing program operation and method of operating the same
Hyung Jin Choi, Icheon-si (KR); and Chan Sik Park, Icheon-si (KR)
Assigned to SK hynix Inc., Icheon-si (KR)
Filed by SK hynix Inc., Icheon-si (KR)
Filed on Nov. 2, 2022, as Appl. No. 17/979,421.
Claims priority of application No. 10-2022-0072982 (KR), filed on Jun. 15, 2022.
Prior Publication US 2023/0409214 A1, Dec. 21, 2023
Int. Cl. G06F 3/06 (2006.01)
CPC G06F 3/0625 (2013.01) [G06F 3/0653 (2013.01); G06F 3/0679 (2013.01)] 12 Claims
OG exemplary drawing
 
1. A semiconductor device, comprising:
a memory cell array including a plurality of memory cells;
a peripheral circuit configured to perform a program operation on memory cells selected from among the plurality of memory cells; and
control logic configured to control the program operation of the peripheral circuit,
wherein the control logic controls the peripheral circuit to precharge bit lines respectively coupled to the selected memory cells to different voltage levels during a verify operation included in the program operation,
wherein the control logic:
determines a first memory cell which has a threshold voltage lower than a verify voltage among the selected memory cells to be programmed to a program state corresponding to the verify voltage based on a result of a previous verify operation which is performed before the verify operation using the verify voltage; and
controls the peripheral circuit to precharge a bit line coupled to the first memory cell to a first level and precharge bit lines coupled to remaining memory cells other than the first memory cell, among the selected memory cells, to a second level lower than the first level.