US 12,204,086 B2
Apparatus and method of estimating values from images
Robert Langlois, San Diego, CA (US); Bo Lu, San Diego, CA (US); Hongji Ren, San Diego, CA (US); Joseph Pinto, Solana Beach, CA (US); Simon Prince, Carlsbad, CA (US); and Austin Corbett, San Diego, CA (US)
Assigned to ILLUMINA, INC., San Diego, CA (US)
Filed by ILLUMINA, INC., San Diego, CA (US)
Filed on Aug. 21, 2023, as Appl. No. 18/236,088.
Application 18/236,088 is a continuation of application No. 17/110,409, filed on Dec. 3, 2020, granted, now 11,768,364.
Claims priority of provisional application 62/944,687, filed on Dec. 6, 2019.
Prior Publication US 2023/0393379 A1, Dec. 7, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G02B 21/36 (2006.01); G02B 21/14 (2006.01); G06T 7/00 (2017.01)
CPC G02B 21/367 (2013.01) [G02B 21/14 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method including:
receiving a plurality of images captured using structured illumination microscopy (SIM) in an optical system, each image of the plurality of images having a first field of view;
defining a window, the window defining a second field of view representing a portion of the first field of view such that the second field of view is smaller than the first field of view;
moving the window in relation to each image of a plurality of images;
capturing a plurality of sub-tiles from each image of the plurality of images while moving the window in relation to each image of the plurality of images,
each sub-tile of the plurality of plurality of sub-tiles representing a portion of the corresponding image of the plurality of images, the portion represented by each sub-tile of the plurality of sub-tiles being defined by the second field of view at a position corresponding to a moment at which the sub-tile of the plurality of sub-tiles is captured;
estimating parameters associated with each sub-tile of the plurality of sub-tiles, the parameters comprising an angle, a spacing, and a phase offset; and
storing the estimated parameters in a predetermined format.