CPC H01S 5/22 (2013.01) [H01S 5/04253 (2019.08); H01S 5/2059 (2013.01); H01S 5/321 (2013.01); H01S 5/3205 (2013.01); H01L 31/022491 (2013.01)] | 9 Claims |
1. A method of producing a semiconductor device, the method comprising:
preparing a laminate that includes:
a first semiconductor layer having a first conductivity type;
a second semiconductor layer having a second conductivity type; and
an active layer between the first semiconductor layer and the second semiconductor layer, wherein
the active layer is in direct contact with the first semiconductor layer and the second semiconductor layer,
the active layer is on the second semiconductor layer, and
the active layer entirely covers a surface of the second semiconductor layer;
forming a transparent conductive layer on the first semiconductor layer, wherein the transparent conductive layer comprises a transparent conductive material;
forming a mask structure on the transparent conductive layer, wherein the mask structure is processed into a stripe shape;
removing at least a part of the transparent conductive layer and the first semiconductor layer, based on the mask structure, as an etching mask;
forming a pad electrode on the transparent conductive layer; and
forming an intermediate layer between the pad electrode and the transparent conductive layer by heat treatment.
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