US 11,874,385 B2
Measuring circuit, measuring device, and program
Tomoyuki Takahashi, Kanagawa (JP)
Assigned to SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa (JP)
Appl. No. 17/250,631
Filed by SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa (JP)
PCT Filed Aug. 16, 2019, PCT No. PCT/JP2019/032145
§ 371(c)(1), (2) Date Feb. 12, 2021,
PCT Pub. No. WO2020/040053, PCT Pub. Date Feb. 27, 2020.
Claims priority of application No. 2018-156422 (JP), filed on Aug. 23, 2018.
Prior Publication US 2021/0311157 A1, Oct. 7, 2021
Int. Cl. G01S 3/28 (2006.01); G01S 19/53 (2010.01); H01Q 9/04 (2006.01)
CPC G01S 3/28 (2013.01) [G01S 19/53 (2013.01); H01Q 9/0407 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A measuring circuit, comprising:
a reception strength acquisition unit configured to acquire reception strengths of received signals received from respective transmitting stations by an antenna that have a specific directivity;
a direction component information acquisition unit configured to acquire azimuth angle information and elevation angle information, from each of the received signals with respect to a position of the antenna used as a reference, of the each of the transmitting stations;
a pattern generation unit configured to map a three-dimensional vector of the azimuth angle information, the elevation angle information, and the reception strength of each of the received signals to a virtual three-dimensional space with the antenna being an origin to generate a first reception strength pattern; and
a comparison unit configured to compare the generated first reception strength pattern with a second reception strength pattern that is a specific reception strength pattern to acquire an inclination of the antenna.