US 11,874,343 B2
Single point gradiometer
Joshua Javor, Cambridge, MA (US); David Bishop, Brookline, MA (US); David Campbell, Brookline, MA (US); and Matthias Imboden, St. Blaise (CH)
Assigned to Trustees of Boston University, Boston, MA (US)
Filed by Trustees of Boston University, Boston, MA (US)
Filed on Feb. 21, 2023, as Appl. No. 18/112,229.
Application 18/112,229 is a continuation of application No. 17/692,692, filed on Mar. 11, 2022, granted, now 11,614,501.
Claims priority of provisional application 63/300,858, filed on Jan. 19, 2022.
Claims priority of provisional application 63/300,907, filed on Jan. 19, 2022.
Claims priority of provisional application 63/159,829, filed on Mar. 11, 2021.
Prior Publication US 2023/0204690 A1, Jun. 29, 2023
Int. Cl. G01R 33/022 (2006.01); G01R 33/038 (2006.01); G01R 33/00 (2006.01)
CPC G01R 33/022 (2013.01) [G01R 33/0052 (2013.01); G01R 33/038 (2013.01); G01R 33/0385 (2013.01)] 21 Claims
OG exemplary drawing
 
1. A gradiometer comprising:
a platform having a first side, a second end opposite the first side, and a fixed support between the first side and second side;
a first magnet attached to a moveable segment of the platform offset from the fixed support and on the first side, the moveable segment of the platform configured to deflect with respect to a polarization axis of the first magnet in response to a magnetic force from an external magnetic field; and
a sensing element configured to measure deflection of the first magnet with respect to the sensing element, wherein the gradiometer directly measures a gradient of the external magnetic field based on the deflection of the first magnet.