US 11,874,316 B2
Generation of patterns for identifying faults in power supply systems
Ulrich Muenz, Plainsboro, NJ (US); Dagmar Beyer, Munich (DE); and Chris Oliver Heyde, Erlangen (DE)
Assigned to Siemens Aktiengesellschaft, Munich (DE)
Appl. No. 16/481,978
Filed by Siemens Aktiengesellschaft, Munich (DE)
PCT Filed Jan. 23, 2018, PCT No. PCT/EP2018/051514
§ 371(c)(1), (2) Date Jul. 30, 2019,
PCT Pub. No. WO2018/141573, PCT Pub. Date Aug. 9, 2018.
Claims priority of application No. 17153978 (EP), filed on Jan. 31, 2017.
Prior Publication US 2020/0003821 A1, Jan. 2, 2020
Int. Cl. G01R 31/08 (2020.01); G01R 31/3183 (2006.01); G05B 19/042 (2006.01); H02J 3/24 (2006.01)
CPC G01R 31/086 (2013.01) [G01R 31/3183 (2013.01); G05B 19/0428 (2013.01); H02J 3/24 (2013.01); G05B 2219/2639 (2013.01); H02J 2203/20 (2020.01)] 8 Claims
OG exemplary drawing
 
1. A method for generating at least one fault pattern for identifying one or more faults in a power supply system, the method comprising:
generating at least one first pattern corresponding to a fault-functioning state of the power supply system using a power supply system simulator, the generating at least one first pattern including simulating phasor measurement unit (PMU) values at various times for the fault-functioning state of the power supply system;
generating at least one second pattern corresponding to a fault-free state of the power supply system using an observer, the generating at least one second pattern including simulating PMU values at various times for the fault-free state of the power supply system;
generating the at least one fault pattern for identifying one or more faults by forming differences between the at least one first pattern and the at least one second pattern; and
storing, in a non-transitory memory, the at least one fault pattern for identifying one or more faults, the at least one fault pattern for identifying one or more faults being assigned to at least one fault from among the one or more faults.