US 11,874,238 B2
Single-crystal X-ray structure analysis apparatus and method, and sample holder and applicator therefor
Takashi Sato, Tokyo (JP)
Assigned to Rigaku Corporation, Tokyo (JP)
Appl. No. 17/295,858
Filed by Rigaku Corporation, Tokyo (JP)
PCT Filed Nov. 21, 2019, PCT No. PCT/JP2019/045690
§ 371(c)(1), (2) Date May 20, 2021,
PCT Pub. No. WO2020/105721, PCT Pub. Date May 28, 2020.
Claims priority of application No. 2018-218732 (JP), filed on Nov. 22, 2018.
Prior Publication US 2022/0128495 A1, Apr. 28, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G01N 23/207 (2018.01); G01N 23/20025 (2018.01)
CPC G01N 23/2076 (2013.01) [G01N 23/20025 (2013.01); G01N 2223/1016 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the single-crystal X-ray structure analysis apparatus comprising:
an X-ray source that generates X-rays;
a sample holder that comprises a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein and that holds a sample;
a goniometer that rotationally moves with the sample holder being attached thereto;
an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer;
an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample;
a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays measured by the X-ray detection measurement section; and
an information acquisition section that acquires inherent information for specifying porous complex crystal,
wherein the inherent information for specifying the porous complex crystal, that is acquired by the information acquisition section, is information held in an information holding section provided on the sample holder, or an applicator inside which the sample holder is stored, and
the structure analysis of the sample is performed based on the acquired inherent information.