US 11,874,225 B2
Measurement device, measurement system, measurement program, and measurement method
Yoshihiro Watanabe, Tokyo (JP); Masatoshi Ishikawa, Tokyo (JP); and Konosuke Kachi, Tokyo (JP)
Assigned to THE UNIVERSITY OF TOKYO
Appl. No. 17/261,680
Filed by THE UNIVERSITY OF TOKYO, Tokyo (JP)
PCT Filed Jul. 26, 2019, PCT No. PCT/JP2019/029375
§ 371(c)(1), (2) Date Jan. 20, 2021,
PCT Pub. No. WO2020/022473, PCT Pub. Date Jan. 30, 2020.
Claims priority of application No. 2018-140773 (JP), filed on Jul. 26, 2018.
Prior Publication US 2021/0262934 A1, Aug. 26, 2021
Int. Cl. G01N 21/57 (2006.01); G01N 21/47 (2006.01)
CPC G01N 21/57 (2013.01) [G01N 21/47 (2013.01); G01N 2021/4711 (2013.01); G01N 2021/4735 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A reflection characteristic measurement device, comprising:
a memory configured to store a program; and
a processor configured to execute the program so as to:
presumptively measure a reflection characteristic of an object by inputting target information into a learned model that has been formed via machine learning in advance, wherein
the target information includes a coordinate positional relationship among a light source position of an incident light, a light detection position of a reflected light, and a measurement point at the object, and the target information includes numerical values related to the incident light and the reflected light,
the incident light is light that is irradiated to the measurement point, and the reflected light is light that is formed by irradiating the incident light to the measurement point and then being reflected at the measurement point,
the learned model has been formed by learning a relationship between the target information in an existing measurement and the reflection characteristic that is measured using at least the target information as a sample, and
a number of combinations of the coordinate positional relationship included in the target information is 1 to 15.