CPC B05B 1/02 (2013.01) [B05B 17/0638 (2013.01); B05B 17/0653 (2013.01); C25D 1/08 (2013.01); C25D 7/04 (2013.01); A61M 11/005 (2013.01); A61M 15/0085 (2013.01); A61M 2207/00 (2013.01)] | 20 Claims |
1. A method of manufacturing an aperture plate wafer, the method comprising:
providing a substrate,
applying a mask over the substrate in a pattern of columns, each column having a top surface;
electroplating a plating material around the columns to form a first thickness;
continuing electroplating the plating material such that the plating material is over-plated to form a second thickness directly on the top surfaces of the pattern of columns so as to form a plurality of aerosol-forming apertures with entry surfaces with a convex shape in a direction of intended flow through the aerosol-forming apertures and wherein the first thickness is greater than the second thickness; and
removing the plated material from the mask and the substrate to provide a wafer of electroplated material with the plurality of aerosol-forming apertures with entry surfaces with a convex shape that are fluidly coupled with a plurality of droplet entrainment openings; and
forming the aperture plate wafer into a domed shape to increase a size of the entrainment openings.
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