US 11,869,746 B2
Multi-beam writing method and multi-beam writing apparatus
Hiroshi Matsumoto, Yokohama (JP); and Yasuo Kato, Yokohama (JP)
Assigned to NuFlare Technology, Inc., Yokohama (JP)
Filed by NuFlare Technology, Inc., Yokohama (JP)
Filed on Jul. 15, 2020, as Appl. No. 16/929,395.
Claims priority of application No. 2019-137074 (JP), filed on Jul. 25, 2019.
Prior Publication US 2021/0027987 A1, Jan. 28, 2021
Int. Cl. H01J 37/317 (2006.01); H01J 37/304 (2006.01)
CPC H01J 37/3177 (2013.01) [H01J 37/3045 (2013.01); H01J 2237/30461 (2013.01); H01J 2237/31764 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A multi-beam writing method for irradiating each pixel of a plurality of pixels defined on a substrate, placed on a stage, with each beam of a multi-beam to form a pattern, the method comprising:
obtaining a corresponding position correction amount of the pattern for each of a plurality of sub-arrays, based on a positional deviation amount of each beam of each of the sub-arrays, the plurality of sub-arrays being determined by dividing an array of the multi-beam at least in a predetermined direction, each of the sub-arrays including a plurality of beams;
calculating a dose of the each beam irradiated to each pixel for shifting a position of the pattern drawn for each of the sub-arrays based on the corresponding position correction amount for each of the sub-arrays; and
performing multi-writing using at least a portion of each of the sub-arrays with the calculated dose wherein an area density distribution of the pattern corresponding to each of the sub-arrays is obtained,
A dose distribution for each of the sub-arrays is obtained from the area density distribution, and the dose distribution is shifted based on the position correction amount, and
The dose of each beam with which the pixel corresponding to the pattern is irradiated is calculated.