US 11,869,569 B2
Semiconductor memory device and memory system
Sang Kyu Kang, Anyang-si (KR); Jieun Shin, Seongnam-si (KR); Hocheol Bang, Hwaseong-si (KR); and Haewon Lee, Hwaseong-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Apr. 15, 2022, as Appl. No. 17/659,475.
Claims priority of application No. 10-2021-0121127 (KR), filed on Sep. 10, 2021.
Prior Publication US 2023/0081557 A1, Mar. 16, 2023
Int. Cl. G11C 16/34 (2006.01); G11C 11/406 (2006.01); G11C 7/10 (2006.01); G11C 11/4076 (2006.01)
CPC G11C 11/40615 (2013.01) [G11C 7/109 (2013.01); G11C 7/1063 (2013.01); G11C 11/4076 (2013.01); G11C 11/40622 (2013.01); G11C 16/3495 (2013.01); G06F 2212/1036 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A semiconductor memory device comprising:
a memory cell array including a plurality of memory cells; and
a control logic circuit configured to receive a clock signal and a command from a memory controller, and to control the semiconductor memory device to transmit data stored in the memory cell array to the memory controller and/or to store the data received from the memory controller in the mentor cell array, the control logic circuit comprising:
a mode register; and
a remaining lifetime calculating device configured to count usage metrics based on one or more of the following:
a number of clock signals received from the memory controller,
an amount of data transmitted or received to or from the memory controller, and/or
a number of commands received from the memory controller,
wherein the control logic circuit generates a remaining lifetime code representing a remaining lifetime of the semiconductor memory device based on the usage metrics, and to store the remaining lifetime code in the mode register.