US 11,868,467 B2
Semiconductor device, control flow inspection method, non-transitory computer readable medium, and electronic device
Astha Jada, Tokyo (JP); Toshiki Kobayashi, Tokyo (JP); Takayuki Sasaki, Tokyo (JP); Daniele Enrico Asoni, Zurich (CH); and Adrian Perrig, Zurich (CH)
Assigned to NEC CORPORATION, Tokyo (JP)
Appl. No. 17/620,804
Filed by NEC Corporation, Tokyo (JP)
PCT Filed Jun. 25, 2019, PCT No. PCT/JP2019/025100
§ 371(c)(1), (2) Date Dec. 20, 2021,
PCT Pub. No. WO2020/261365, PCT Pub. Date Dec. 30, 2020.
Prior Publication US 2022/0358211 A1, Nov. 10, 2022
Int. Cl. G06F 21/54 (2013.01); G06F 21/53 (2013.01)
CPC G06F 21/54 (2013.01) [G06F 21/53 (2013.01)] 12 Claims
OG exemplary drawing
 
1. A semiconductor device comprising:
at least one memory configured to store instructions; and
at least one processor configured to execute the instructions to:
acquire, as determination auxiliary information, at least one input value to a target code block to be executed among a plurality of code blocks in a predetermined program;
determine whether an avoidance condition of inspection of control flow integrity is satisfied based on the at least one input value to the target code block, by checking whether a data content of the at least one input value matches a predetermined value or whether a data size of the at least one input value is within a predetermined range; in response to the determination indicating that the avoidance condition has been satisfied, not perform avoid the inspection of the control flow integrity in the target code block;
in response to the determination indicating that the avoidance condition has not been satisfied, perform the inspection of the control flow integrity in the target code block,
wherein not performing the inspection of the control flow integrity when the avoidance condition has been satisfied reduces processing overhead while maintaining security during execution of the predetermined program.