US 11,867,569 B2
Temperature abnormality detection system, temperature abnormality detection method, and computer-readable recording medium
Ryo Ikeuchi, Kumamoto (JP); Takaaki Yamada, Kusatsu (JP); and Tatsuaki Kozono, Kusatsu (JP)
Assigned to OMRON CORPORATION, Kyoto (JP)
Filed by OMRON Corporation, Kyoto (JP)
Filed on Mar. 31, 2021, as Appl. No. 17/218,883.
Application 17/218,883 is a continuation of application No. PCT/JP2019/036450, filed on Sep. 18, 2019.
Claims priority of application No. 2018-205484 (JP), filed on Oct. 31, 2018.
Prior Publication US 2021/0215546 A1, Jul. 15, 2021
Int. Cl. H02H 5/00 (2006.01); G01K 3/14 (2006.01); G01K 3/00 (2006.01); H02H 1/00 (2006.01); H02H 5/04 (2006.01)
CPC G01K 3/14 (2013.01) [G01K 3/005 (2013.01); H02H 1/0007 (2013.01); H02H 5/04 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A temperature abnormality detection system that detects a temperature abnormality of a target device installed in a board casing of a board; the temperature abnormality detection system comprising:
a first temperature sensor that includes a radiation temperature sensor installed in the board casing and measures a first temperature indicated by the target device by the radiation temperature sensor;
a second temperature sensor that measures a second temperature indicated by ambient air around the target device; and
an abnormality determination unit that calculates a temperature difference between the first temperature and the second temperature, and determines that a temperature abnormality of the target device has occurred when the temperature difference becomes a predetermined threshold value or more.