US 11,867,500 B2
Time-of-flight (TOF) assisted structured light imaging
Sanjeev Jagannatha Koppal, Gainesville, FL (US); and Vikram Vijayanbabu Appia, Dallas, TX (US)
Assigned to Texas Instruments Incorporated, Dallas, TX (US)
Filed by TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed on Jul. 6, 2020, as Appl. No. 16/920,832.
Application 16/920,832 is a continuation of application No. 16/039,114, filed on Jul. 18, 2018, granted, now 10,739,463.
Application 16/039,114 is a continuation of application No. 14/478,858, filed on Sep. 5, 2014, granted, now 10,061,028, issued on Aug. 28, 2018.
Claims priority of provisional application 61/874,042, filed on Sep. 5, 2013.
Prior Publication US 2020/0333467 A1, Oct. 22, 2020
This patent is subject to a terminal disclaimer.
Int. Cl. G01B 11/25 (2006.01); G01S 17/46 (2006.01); G01S 17/894 (2020.01)
CPC G01B 11/2527 (2013.01) [G01S 17/46 (2013.01); G01S 17/894 (2020.01)] 16 Claims
OG exemplary drawing
 
1. A method comprising:
identifying a first location in a time-of-flight (TOF) depth image using a projector-TOF sensor calibration matrix;
identifying a projector plane location in a camera image based on the TOF depth image by at least mapping the first location in the TOF depth image to the projector plane location using a camera-TOF sensor calibration matrix;
identifying a second location in a structured light image based on a phase value of the second location and further based on a phase value of the projector plane location; and
computing a depth value based on the second location.